Quasielastic scattering from relativistic bound nucleons: R[sub TL] response

1999 ◽  
Author(s):  
J. A. Caballero ◽  
E. Moya de Guerra ◽  
J. M. Udı́as ◽  
J. E. Amaro ◽  
T. W. Donnelly
Keyword(s):  
Quasielastic Scattering

Neutron quasielastic scattering from dynamic disorder in PbF2 and BaF2

1980 ◽  
Vol 80 (4) ◽  
pp. 337-341 ◽  
Author(s):  
M.H. Dickens ◽  
W. Hayes ◽  
C. Smith ◽  
M.T. Hutchings ◽  
R.E. Lechner
Keyword(s):  
Quasielastic Scattering ◽  
Dynamic Disorder

scholarly journals Study of Quasielastic scattering for 7Li+159Tb at around- barrier energies

2017 ◽  
Vol 163 ◽  
pp. 00039
Author(s):  
A. Mukherjee ◽  
Piyasi Biswas ◽  
Md. Moin Shaikh ◽  
Subinit Roy ◽  
A. Goswami ◽  
...  
Keyword(s):  
Quasielastic Scattering

Calorimetry, Proton Magnetic Resonance and Neutron Quasielastic Scattering Studies of [Mg(H2O)6](NO3)2

1983 ◽  
Vol 28 (5) ◽  
pp. 569-572 ◽  
Author(s):  
J M Janik ◽  
E Mikuli ◽  
A Migdal-Mikuli ◽  
M Rachwalska ◽  
T Stanek ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Proton Magnetic Resonance ◽  
Quasielastic Scattering

Position-sensitive analysis in curved-crystal three-axis neutron spectrometry (quasielastic scattering case)

2000 ◽  
Vol 33 (1) ◽  
pp. 147-155 ◽  
Author(s):  
A. D. Stoica ◽  
M. Popovici ◽  
W. B. Yelon ◽  
R. Berliner
Keyword(s):  
Silicon Wafers ◽  
Space Theory ◽  
Quasielastic Scattering ◽  
Neutron Spectrometry ◽  
Cold Source ◽  
Demonstration Experiment ◽  
Phase Space Theory ◽  
Position Sensitive ◽  
The Individual ◽  
The Right

The use of bent perfect crystals in focusing three-axis neutron spectrometry with position-sensitive detection (PSD) is analyzed on the basis of a phase-space theory. With PSD, the usual sequential scans are replaced by simultaneous scans. The case of high resolution in energy transfer is considered in detail. With commercial thin silicon wafers, the achievable resolutions are in the 10–150 µeV range, depending on neutron energy. Resolutions around 10 µeV are obtained on the peak of cold-source spectra. To take advantage of the possibilities offered by silicon wafers, PSD with spatial resolution well below 1 mm will be needed. With PSD analysis, a new kind of focusing exists that allows the thickness of bent perfect analyzer crystals to be increased, providing an intensity gain at no resolution loss. With multilamella assemblies a gain in count rate by the number of lamellae in the packet is achievable. Results of a demonstration experiment are presented, confirming that under the right conditions, a multilamella analyzer may resemble a single bent wafer, the individual curves of many wafers having been combined to provide the intensity gain.

scholarly journals Large back-angle quasielastic scattering for Li7+Tb159

2021 ◽  
Vol 103 (1) ◽  
Author(s):  
Piyasi Biswas ◽  
A. Mukherjee ◽  
D. Chattopadhyay ◽  
Saikat Bhattacharjee ◽  
M. K. Pradhan ◽  
...  
Keyword(s):  
Quasielastic Scattering ◽  
Back Angle

Analyses of quasielastic scattering data for the $$^{11}$$Be + $$^{197}$$Au system

2021 ◽  
Author(s):  
Kyoungsu Heo ◽  
Myung-Ki Cheoun ◽  
W. Y. So ◽  
Ki-Seok Choi ◽  
K. S. Kim
Keyword(s):  
Scattering Data ◽  
Quasielastic Scattering
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