Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate
2000 ◽
Vol 71
(9)
◽
pp. 3478-3479
◽
1987 ◽
Vol 81
(1-4)
◽
pp. 13-18
◽
1991 ◽
Vol 62
(3)
◽
pp. 655-659
◽
1998 ◽
Vol 57
(24)
◽
pp. 15372-15375
◽
Keyword(s):
1990 ◽
Vol 48
(2)
◽
pp. 396-397
1998 ◽
Vol 37
(Part 2, No. 2A)
◽
pp. L164-L166
◽
Keyword(s):
1997 ◽
Vol 15
(3)
◽
pp. 911-914
◽