In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3

Z. Xu; X. Tan; P. Han; J. K. Shang

doi:10.1063/1.126765

In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3

Applied Physics Letters ◽

10.1063/1.126765 ◽

2000 ◽

Vol 76 (25) ◽

pp. 3732-3734 ◽

Cited By ~ 34

Author(s):

Z. Xu ◽

X. Tan ◽

P. Han ◽

J. K. Shang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electric Field ◽

Single Crystal ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ transmission electron microscopy study of the microstructural origins for the electric field-induced phenomena in ferroelectric perovskites

10.31274/etd-180810-3255 ◽

2014 ◽

Author(s):

Hanzheng Guo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electric Field ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ transmission electron microscopy study of electric-field-induced 90° domain switching in BaTiO3 single crystals

Applied Physics Letters ◽

10.1063/1.2345231 ◽

2006 ◽

Vol 89 (9) ◽

pp. 092908 ◽

Cited By ~ 17

Author(s):

X. Y. Qi ◽

H. H. Liu ◽

X. F. Duan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electric Field ◽

Single Crystals ◽

Domain Switching ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ transmission electron microscopy study of the microstructural origins for the electric field-induced phenomena in ferroelectric perovskites

10.2172/1342570 ◽

2014 ◽

Author(s):

Hanzheng Guo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electric Field ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ transmission electron microscopy study on Nb-doped Pb(Zr0.95Ti0.05)O3ceramics

Microscopy Research and Technique ◽

10.1002/jemt.20674 ◽

2009 ◽

Vol 72 (3) ◽

pp. 216-222 ◽

Cited By ~ 4

Author(s):

Weiguo Qu ◽

Xiaoli Tan ◽

Pin Yang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of the reaction of Sn4−9 zintl ions with single crystal Au films

Ultramicroscopy ◽

10.1016/0304-3991(87)90159-8 ◽

1987 ◽

Vol 23 (2) ◽

pp. 135-149 ◽

Cited By ~ 3

Author(s):

M.M.J. Treacy ◽

R.C. Haushalter ◽

S.B. Rice

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Single Crystal ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Zintl Ions

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Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study

Scientific Reports ◽

10.1038/s41598-018-31053-w ◽

2018 ◽

Vol 8 (1) ◽

Cited By ~ 5

Author(s):

Haider Ali ◽

Supriya Koul ◽

Geoffrey Gregory ◽

James Bullock ◽

Ali Javey ◽

...

Keyword(s):

Electron Microscopy ◽

Thermal Stability ◽

Transmission Electron Microscopy ◽

Tungsten Oxide ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Thermal Stability Of

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In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus

2D Materials ◽

10.1088/2053-1583/abce09 ◽

2020 ◽

Vol 8 (2) ◽

pp. 025004

Author(s):

Fenfa Yao ◽

Yongqing Cai ◽

Zhangru Xiao ◽

Gang Zhang ◽

Rong-Jun Xie ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Black Phosphorus ◽

Transmission Electron Microscopy Study ◽

Vacancy Defects ◽

Transmission Electron ◽

And Migration

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