Local structure and bonding of Er in GaN: A contrast with Er in Si

2000 ◽  
Vol 76 (20) ◽  
pp. 2865-2867 ◽  
Author(s):  
P. H. Citrin ◽  
P. A. Northrup ◽  
R. Birkhahn ◽  
A. J. Steckl
Keyword(s):  
Local Structure ◽  
Structure And Bonding

Local Structure and Bonding of Transition Metal Dopants in Bi2Se3 Topological Insulator Thin Films

2015 ◽  
Vol 119 (30) ◽  
pp. 17344-17351 ◽  
Author(s):  
Adriana I. Figueroa ◽  
Gerrit van der Laan ◽  
Liam J. Collins-McIntyre ◽  
Giannantonio Cibin ◽  
Andrew J. Dent ◽  
...  
Keyword(s):  
Thin Films ◽  
Transition Metal ◽  
Topological Insulator ◽  
Local Structure ◽  
Structure And Bonding

Local structure and bonding states ina‐Si1−xCx:H

1994 ◽  
Vol 76 (1) ◽  
pp. 251-256 ◽  
Author(s):  
R. A. C. M. M. van Swaaij ◽  
A. J. M. Berntsen ◽  
W. G. J. H. M. van Sark ◽  
H. Herremans ◽  
J. Bezemer ◽  
...  
Keyword(s):  
Local Structure ◽  
Structure And Bonding

scholarly journals Local Structure and Bonding of Carbon Nanothreads Probed by High-Resolution Transmission Electron Microscopy

2019 ◽  
Vol 141 (17) ◽  
pp. 6937-6945 ◽  
Author(s):  
Stephen J. Juhl ◽  
Tao Wang ◽  
Brian Vermilyea ◽  
Xiang Li ◽  
Vincent H. Crespi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Local Structure ◽  
Transmission Electron ◽  
Structure And Bonding

Te and Cd nuclear-magnetic-resonance study of local structure and bonding inCd1−xZnxTe

1987 ◽  
Vol 36 (12) ◽  
pp. 6420-6425 ◽  
Author(s):  
Kebede Beshah ◽  
David Zamir ◽  
Piotr Becla ◽  
Peter A. Wolff ◽  
Robert G. Griffin
Keyword(s):  
Nuclear Magnetic Resonance ◽  
Magnetic Resonance ◽  
Local Structure ◽  
Nuclear Magnetic Resonance Study ◽  
Magnetic Resonance Study ◽  
Structure And Bonding ◽  
Nuclear Magnetic

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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