In situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films

2000 ◽  
Vol 76 (3) ◽  
pp. 309-311 ◽  
Author(s):  
Stefan P. Hau-Riege ◽  
Carl V. Thompson
Keyword(s):  
Electron Microscope ◽  
Grain Growth ◽  
Transmission Electron Microscope ◽  
Abnormal Grain Growth ◽  
Copper Films ◽  
Transmission Electron ◽  
Electroplated Copper ◽  
Kinetics Of

scholarly journals An in situ transmission electron microscope investigation into grain growth and ordering of sputter-deposited nanocrystalline Ni3Al thin films

2002 ◽  
Vol 17 (8) ◽  
pp. 2085-2094 ◽  
Author(s):  
H. P. Ng ◽  
A. H. W. Ngan
Keyword(s):  
Electron Microscope ◽  
Grain Growth ◽  
Transmission Electron Microscope ◽  
Growth Kinetics ◽  
Abnormal Grain Growth ◽  
Face Centered Cubic ◽  
Transmission Electron ◽  
Sputter Deposited ◽  
Grain Growth Kinetics

The grain growth kinetics and ordering behavior of direct-current magnetron sputter-deposited Ni75at.%Al25at.% alloy films were investigated using in situ isothermal annealing in a transmission electron microscope. Both normal and abnormal grain growth modes were observed. The normal grain growth kinetics under isothermal heating from 300 to 700 °C were found to comply with the Burke law d = K/dn−1, where d is grain size and K and n are constants with respect to time. The grain boundary mobility parameter K was found to obey an Arrehnius rate law with an apparent activation energy of 1.6 eV, and n was found to increase gradually from 5.2 at 300 °C to 8.7 at 700 °C. Abnormal grain growth occurred at 500 °C or higher, and grain coalescence was identified as an important operative mechanism. It was also observed that the initially as-deposited state of the films was crystalline with a disordered face-centered-cubic structure, but ordering into the equilibrium L12 intermetallic structure followed from annealing at temperatures above approximately 500 °C.

Grain Boundary Responses to Local and Applied Stress: An In Situ TEM Deformation Study

2006 ◽  
Vol 976 ◽  
Author(s):  
Bryan Miller ◽  
Jamey Fenske ◽  
Dong Su ◽  
Chung-Ming Li ◽  
Lisa Dougherty ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Grain Growth ◽  
Transmission Electron Microscope ◽  
In Situ Tem ◽  
Deformation Twins ◽  
Transmission Electron ◽  
Dislocation Interactions

AbstractDeformation experiments at temperatures between 300 and 750 K have been performed in situ in the transmission electron microscope to investigate dislocation interactions and reactions with grain boundaries and other obstacles. Dislocations, both partial and perfect, as well as deformation twins have been observed being emitted from grain boundaries and, in some cases, even the same grain boundary. The ejection of dislocations from the grain boundary can result in its partial or total annihilation. In the latter case, the disintegration of the grain boundary was accompanied by grain growth and a change in misorientation.

Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films

2018 ◽  
Vol 24 (6) ◽  
pp. 647-656 ◽  
Author(s):  
Yueying Wu ◽  
Chenze Liu ◽  
Thomas M. Moore ◽  
Gregory A. Magel ◽  
David A. Garfinkel ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Phase Separation ◽  
Grain Growth ◽  
Transmission Electron Microscope ◽  
Growth Phase ◽  
Continuous Wave ◽  
Optical Power ◽  
Ex Situ ◽  
Transmission Electron

AbstractA new optical delivery system has been developed for the (scanning) transmission electron microscope. Here we describe the in situ and “rapid ex situ” photothermal heating modality of the system, which delivers >200 mW of optical power from a fiber-coupled laser diode to a 3.7 μm radius spot on the sample. Selected thermal pathways can be accessed via judicious choices of the laser power, pulse width, number of pulses, and radial position. The long optical working distance mitigates any charging artifacts and tremendous thermal stability is observed in both pulsed and continuous wave conditions, notably, no drift correction is applied in any experiment. To demonstrate the optical delivery system’s capability, we explore the recrystallization, grain growth, phase separation, and solid state dewetting of a Ag0.5Ni0.5 film. Finally, we demonstrate that the structural and chemical aspects of the resulting dewetted films was assessed.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

scholarly journals In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Zhongquan Liao ◽  
Leonardo Medrano Sandonas ◽  
Tao Zhang ◽  
Martin Gall ◽  
Arezoo Dianat ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Graphene Nanoribbons ◽  
Transmission Electron

scholarly journals In situ disordering of monoclinic titanium monoxide Ti5O5 studied by transmission electron microscope TEM

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
А. А. Rempel ◽  
W. Van Renterghem ◽  
А. А. Valeeva ◽  
M. Verwerft ◽  
S. Van den Berghe
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Titanium Monoxide ◽  
Transmission Electron
Sign in / Sign up

Export Citation Format

Share Document