Dielectric properties of metal-organic chemical vapor deposited highly textured Pb(ScTa)1−xTixO3 (x=0–0.3) relaxor ferroelectric thin films on LaNiO3 electrode buffered Si

1999 ◽  
Vol 75 (16) ◽  
pp. 2485-2487 ◽  
Author(s):  
C. H. Lin ◽  
S. W. Lee ◽  
Haydn Chen ◽  
T. B. Wu
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