A cryogenic amplifier for direct measurement of high-frequency signals from a single-electron transistor

1999 ◽  
Vol 74 (19) ◽  
pp. 2884-2886 ◽  
Author(s):  
S. L. Pohlen ◽  
R. J. Fitzgerald ◽  
J. M. Hergenrother ◽  
M. Tinkham
1996 ◽  
Vol 53 (20) ◽  
pp. R13272-R13274 ◽  
Author(s):  
J. Pettersson ◽  
P. Wahlgren ◽  
P. Delsing ◽  
D. B. Haviland ◽  
T. Claeson ◽  
...  

Author(s):  
Yoshiaki Iwata ◽  
Tomoki Nishimura ◽  
Alka Singh ◽  
Hiroaki Satoh ◽  
Hiroshi Inokawa

Abstract Metallic single-electron transistors (SETs) with niobium nanodots were fabricated, and their high-frequency rectifying characteristics were evaluated. By reducing the gap size of the electrodes and film deposition area to nanometer scale, improved SET characteristics with gate control, and better frequency response of the rectifying current with gentler decrease than 1/f at high frequency were achieved. The comparison between the characteristics of micrometer- and nanometer-size devices are made, and the reason for their differences are discussed with a help of simulation based on the experimentally extracted parameters.


Author(s):  
Hiroto Takenaka ◽  
Michito Shinohara ◽  
Takafumi Uchida ◽  
Masashi Arita ◽  
Akira Fujiwara ◽  
...  

2001 ◽  
Vol 89 (1) ◽  
pp. 410-419 ◽  
Author(s):  
Nicole Y. Morgan ◽  
David Abusch-Magder ◽  
Marc A. Kastner ◽  
Yasuo Takahashi ◽  
Hiroyuki Tamura ◽  
...  

2021 ◽  
Vol 327 ◽  
pp. 114234
Author(s):  
Vahideh Khademhosseini ◽  
Daryoosh Dideban ◽  
Mohammad Taghi Ahmadi

Author(s):  
Kumar Gaurav ◽  
Boddepalli SanthiBhushan ◽  
Ravi Mehla ◽  
Anurag Srivastava

Nature ◽  
1985 ◽  
Vol 316 (6030) ◽  
pp. 712-714 ◽  
Author(s):  
S. Fukao ◽  
K. Wakasugi ◽  
T. Sato ◽  
S. Morimoto ◽  
T. Tsuda ◽  
...  

1994 ◽  
Vol 203 (3-4) ◽  
pp. 327-339 ◽  
Author(s):  
J.M. Hergenrother ◽  
M.T. Tuominen ◽  
J.G. Lu ◽  
D.C. Ralph ◽  
M. Tinkham

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