Interfacial defects in thin refractory metal films imaged by low-energy electron microscopy

1999 ◽  
Vol 74 (18) ◽  
pp. 2626-2628 ◽  
Author(s):  
W. Świȩch ◽  
M. Mundschau ◽  
C. P. Flynn
Keyword(s):  
Electron Microscopy ◽  
Refractory Metal ◽  
Metal Films ◽  
Low Energy ◽  
Energy Electron ◽  
Interfacial Defects ◽  
Low Energy Electron

The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites

Microscopy ◽  
2005 ◽  
Vol 54 (2) ◽  
pp. 109-117 ◽  
Author(s):  
Kenji Matsuda ◽  
Susumu Ikeno ◽  
Ilona Müllerová ◽  
Luděk Frank
Keyword(s):  
Electron Microscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron

Spin Polarized Low Energy Electron Microscopy (Spleem) of Single and Combined Layers of Co, Cu, and Pd on W (110)

1993 ◽  
Vol 313 ◽  
Author(s):  
Helmut Poppa ◽  
Heiko Pinkvos ◽  
Karsten Wurm ◽  
Ernst Bauer
Keyword(s):  
Electron Microscopy ◽  
Band Structure ◽  
Film Growth ◽  
Magnetic Domain ◽  
Low Energy ◽  
Energy Electron ◽  
Magnetic Studies ◽  
Deposition Rates ◽  
Spin Polarized ◽  
Low Energy Electron

ABSTRACTIn-situ recording of ultra-thin film growth by Low Energy Electron Microscopy (LEEM) results in accurate determinations of monolayer metal deposition rates for difficult to calibrate deposition geometries. Deposition rates and growth features were determined for Cu and Co on W (110) allowing for thickness control at the submonolayer level. Also, the transparencies of non-Magnetic overlayers of Pd (111) and Cu (111) to very low energy spin polarized electrons were compared and qualitatively explained by band structure considerations. Cu (111) is much more transparent than Pd (111) so that magnetic domain structures can be observed through at least 4 nmof Cu (111). This suggests the use of Cu (111) and other metals of suitable band structure as protective layers for surface magnetic studies.

Tailoring Si(100) substrate surfaces for GaP growth by Ga deposition: A low-energy electron microscopy study

2015 ◽  
Vol 118 (5) ◽  
pp. 055701 ◽  
Author(s):  
Michael Rienäcker ◽  
Benjamin Borkenhagen ◽  
Gerhard Lilienkamp ◽  
Winfried Daum
Keyword(s):  
Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Substrate Surfaces
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