Quantitative characterization of GaN quantum-dot structures in AlN by high-resolution transmission electron microscopy
1993 ◽
Vol 57
(5)
◽
pp. 393-400
◽
2000 ◽
Vol 39
(Part 1, No. 3A)
◽
pp. 1278-1285
◽
2015 ◽
Vol 95
(3)
◽
pp. 145-151
◽