Erratum: “High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork” [Appl. Phys. Lett. 73, 3956 (1998)]

1999 ◽  
Vol 74 (26) ◽  
pp. 4070-4070 ◽  
Author(s):  
Franz J. Giessibl
Keyword(s):  
High Speed ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy

scholarly journals Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

2014 ◽  
Vol 105 (4) ◽  
pp. 043107 ◽  
Author(s):  
Hiroaki Ooe ◽  
Tatsuya Sakuishi ◽  
Makoto Nogami ◽  
Masahiko Tomitori ◽  
Toyoko Arai
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy ◽  
Atomic Force

Optimizing the Quality Factor of Quartz Tuning Fork Force Sensor for Atomic Force Microscopy: Impact of Additional Mass and Mass Rebalance

2017 ◽  
Vol 17 (9) ◽  
pp. 2797-2806 ◽  
Author(s):  
Danish Hussain ◽  
Jianmin Song ◽  
Hao Zhang ◽  
Xianghe Meng ◽  
Wen Yongbing ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quality Factor ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Additional Mass ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor

Sensors ◽  
2018 ◽  
Vol 18 (2) ◽  
pp. 100 ◽  
Author(s):  
Danish Hussain ◽  
Yongbing Wen ◽  
Hao Zhang ◽  
Jianmin Song ◽  
Hui Xie
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

2012 ◽  
Vol 3 ◽  
pp. 249-259 ◽  
Author(s):  
Zsolt Majzik ◽  
Martin Setvín ◽  
Andreas Bettac ◽  
Albrecht Feltz ◽  
Vladimír Cháb ◽  
...  
Keyword(s):  
Cross Talk ◽  
Tuning Fork ◽  
Tunneling Current ◽  
Quartz Tuning Fork ◽  
Scanning Tunneling ◽  
Experimental Setup ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Signal ◽  
Reported Data

We present the results of simultaneous scanning-tunneling and frequency-modulated dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a purely electrical sensor based on a quartz tuning fork. If both the tunneling current and the force signal are to be measured at the tip, a cross-talk of the tunneling current with the force signal can easily occur. The origin and general features of the capacitive cross-talk will be discussed in detail in this contribution. Furthermore, we describe an experimental setup that improves the level of decoupling between the tunneling-current and the deflection signal. The efficiency of this experimental setup is demonstrated through topography and site-specific force/tunneling-spectroscopy measurements on the Si(111) 7×7 surface. The results show an excellent agreement with previously reported data measured by optical interferometric deflection.

Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

2014 ◽  
Vol 85 (3) ◽  
pp. 035003 ◽  
Author(s):  
V. T. A. Oiko ◽  
B. V. C. Martins ◽  
P. C. Silva ◽  
V. Rodrigues ◽  
D. Ugarte
Keyword(s):  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Range

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

2021 ◽  
Vol 71 (5) ◽  
pp. 439-445
Author(s):  
Hyoju CHOE ◽  
Dongwon KIM ◽  
Manhee LEE* ◽  
Myungchul CHOI
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Sensors ◽  
2019 ◽  
Vol 19 (8) ◽  
pp. 1794 ◽  
Author(s):  
Sangmin An ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
High Sensitivity ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Au Nanoparticle ◽  
Ambient Conditions ◽  
Atomic Force ◽  
In Situ Detection

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

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