Dependence on the microwave field of the surface resistance for YBa2Cu3O7−δ films fabricated on copper substrates

1998 ◽  
Vol 73 (23) ◽  
pp. 3450-3452 ◽  
Author(s):  
Jian-Fei Liu ◽  
Kiyomitsu Asano ◽  
Eizi Ezura ◽  
Shigemi Inagaki ◽  
Shigeru Isagawa ◽  
...  
Keyword(s):  
Surface Resistance ◽  
Microwave Field

Nature of anomalous behavior of the surface resistance of YBa2Cu3O7−δ films in a microwave field

1999 ◽  
Vol 25 (5) ◽  
pp. 327-331
Author(s):  
V. G. Prokhorov ◽  
G. G. Kaminsky ◽  
Yong Pak Lee
Keyword(s):  
Surface Resistance ◽  
Microwave Field ◽  
Anomalous Behavior

scholarly journals Properties of thin metallic films for microwave susceptors

2011 ◽  
Vol 21 (No. 1) ◽  
pp. 34-40 ◽  
Author(s):  
J. Česnek ◽  
J. Dobiáš ◽  
J. Houšová ◽  
J. Sedláček
Keyword(s):  
Microwave Absorption ◽  
Direct Current ◽  
Microwave Power ◽  
Surface Resistance ◽  
Microwave Field ◽  
Metallic Films ◽  
Absorption Properties ◽  
Microwave Absorption Properties ◽  
Polyethylene Terephthalate Film ◽  
Varying Thickness

Thin Al films of varying thickness, i.e. 3 to 30 nm, were deposited onto polyethylene-terephthalate film by evaporation in the vacuum of 3 &times; 10<sup>&ndash;3</sup> Pa. The dependence of DC (direct current) surface resistance on thickness was measured using a four-point method. The surface resistance exhibits the size effect in accordance with the Fuchs-Sondheimer theory. The microwave absorption properties of the prepared films of various metallization thickness were measured in a microwave field at the microwave power of 1.8 mW. The maximum microwave absorption at 2.45 GHz was found to occur in a layer of optical density of about 0.22. &nbsp;

Interference Effects of a Powerful Pulsed Microwave Field on Microphone Devices

2007 ◽  
Vol 66 (17) ◽  
pp. 1583-1590
Author(s):  
A. V. Berdyshev ◽  
V. V. Shcherenkov ◽  
A. P. Yarygin ◽  
Vladimir B. Avdeev
Keyword(s):  
Microwave Field ◽  
Interference Effects
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