Study of microstructure of high stability hydrogenated amorphous silicon films by Raman scattering and infrared absorption spectroscopy

1998 ◽  
Vol 73 (3) ◽  
pp. 336-338 ◽  
Author(s):  
Shuran Sheng ◽  
Xianbo Liao ◽  
Guanglin Kong ◽  
Hexiang Han
1991 ◽  
Vol 55 (4) ◽  
pp. 1037-1041 ◽  
Author(s):  
V. N. Denisov ◽  
B. N. Mavrin ◽  
M. Koosh ◽  
I. Pochik

2013 ◽  
Vol 49 (9) ◽  
pp. 610-612
Author(s):  
K. Tanizawa ◽  
S. Suda ◽  
Y. Sakakibara ◽  
T. Kamei ◽  
R. Takei ◽  
...  

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