Study of microstructure of high stability hydrogenated amorphous silicon films by Raman scattering and infrared absorption spectroscopy
1985 ◽
Vol 24
(Part 2, No. 11)
◽
pp. L861-L863
◽
2001 ◽
Vol 395
(1-2)
◽
pp. 138-141
◽
1991 ◽
Vol 55
(4)
◽
pp. 1037-1041
◽
Keyword(s):
2016 ◽
Vol 55
(4S)
◽
pp. 04ES05
◽
Keyword(s):