Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry

P. L. Washington; H. C. Ong; J. Y. Dai; R. P. H. Chang

doi:10.1063/1.121617

Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry

Applied Physics Letters ◽

10.1063/1.121617 ◽

1998 ◽

Vol 72 (25) ◽

pp. 3261-3263 ◽

Cited By ~ 150

Author(s):

P. L. Washington ◽

H. C. Ong ◽

J. Y. Dai ◽

R. P. H. Chang

Keyword(s):

Thin Films ◽

Zinc Oxide ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Oxide Thin Films

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Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

Acta Optica Sinica ◽

10.3788/aos201535.0431001 ◽

2015 ◽

Vol 35 (4) ◽

pp. 0431001 ◽

Cited By ~ 1

Author(s):

李江 Li Jiang ◽

李沛 Li Pei ◽

黄峰 Huang Feng ◽

魏贤华 Wei Xianhua ◽

葛芳芳 Ge Fangfang ◽

...

Keyword(s):

Thin Films ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Accurate Determination

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Nitrogen-doped zinc oxide thin films biosensor for determination of uric acid

The Analyst ◽

10.1039/c3an36695b ◽

2013 ◽

Vol 138 (15) ◽

pp. 4353 ◽

Cited By ~ 48

Author(s):

Kajal Jindal ◽

Monika Tomar ◽

Vinay Gupta

Keyword(s):

Thin Films ◽

Zinc Oxide ◽

Uric Acid ◽

Oxide Thin Films ◽

Nitrogen Doped

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Determination of Optical Constants of Thin Films in the VUV and Soft X-ray Spectral Region with Synchrotron Spectroscopic Ellipsometry

Optical Interference Coatings ◽

10.1364/oic.2007.fa6 ◽

2007 ◽

Author(s):

Minghong Yang

Keyword(s):

Thin Films ◽

Spectroscopic Ellipsometry ◽

Spectral Region ◽

Optical Constants ◽

X Ray

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Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

Applied Optics ◽

10.1364/ao.37.000691 ◽

1998 ◽

Vol 37 (4) ◽

pp. 691 ◽

Cited By ~ 54

Author(s):

Md. Mosaddeq-ur-Rahman ◽

Guolin Yu ◽

Kalaga Murali Krishna ◽

Tetsuo Soga ◽

Junji Watanabe ◽

...

Keyword(s):

Thin Films ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Transmission Spectroscopy

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Optical constants and band edge of amorphous zinc oxide thin films

Thin Solid Films ◽

10.1016/j.tsf.2007.03.055 ◽

2007 ◽

Vol 515 (18) ◽

pp. 7393-7399 ◽

Cited By ~ 59

Author(s):

Jebreel M. Khoshman ◽

Martin E. Kordesch

Keyword(s):

Thin Films ◽

Zinc Oxide ◽

Optical Constants ◽

Band Edge ◽

Oxide Thin Films

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Determination of optical constants of Cd1−xZnxTe thin films by spectroscopic ellipsometry

Thin Solid Films ◽

10.1016/s0040-6090(02)00915-x ◽

2003 ◽

Vol 424 (1) ◽

pp. 66-69 ◽

Cited By ~ 7

Author(s):

K. Prabakar ◽

M. Sridharan ◽

Sa.K. Narayandass ◽

D. Mangalaraj ◽

Vishnu Gopal

Keyword(s):

Thin Films ◽

Spectroscopic Ellipsometry ◽

Optical Constants

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Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range

Applied Surface Science ◽

10.1016/j.apsusc.2014.04.073 ◽

2014 ◽

Vol 307 ◽

pp. 558-565 ◽

Cited By ~ 13

Author(s):

J.M. Khoshman ◽

J.N. Hilfiker ◽

N. Tabet ◽

M.E. Kordesch

Keyword(s):

Thin Films ◽

Zinc Oxide ◽

Wavelength Range ◽

Optical Constants ◽

Oxide Thin Films ◽

Polycrystalline Zinc ◽

Wide Wavelength Range ◽

Oscillator Models

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Optical constants and band gap determination of Pb0.95La0.05Zr0.54Ti0.46O3 thin films using spectroscopic ellipsometry and UV–visible spectroscopy

Optical Materials ◽

10.1016/j.optmat.2015.08.019 ◽

2015 ◽

Vol 49 ◽

pp. 123-128 ◽

Cited By ~ 21

Author(s):

Vaishali Batra ◽

Sushma Kotru ◽

M. Varagas ◽

C.V. Ramana

Keyword(s):

Thin Films ◽

Band Gap ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Visible Spectroscopy ◽

Uv Visible

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Extraction of optical constants of zinc oxide thin films by ellipsometry with various models

Thin Solid Films ◽

10.1016/j.tsf.2005.10.089 ◽

2006 ◽

Vol 510 (1-2) ◽

pp. 32-38 ◽

Cited By ~ 90

Author(s):

Y.C. Liu ◽

J.H. Hsieh ◽

S.K. Tung

Keyword(s):

Thin Films ◽

Zinc Oxide ◽

Optical Constants ◽

Oxide Thin Films

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A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization

Solid State Communications ◽

10.1016/j.ssc.2003.11.044 ◽

2004 ◽

Vol 129 (8) ◽

pp. 491-495 ◽

Cited By ~ 23

Author(s):

Yeon Sik Jung

Keyword(s):

Thin Films ◽

Indium Oxide ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Oxide Thin Films

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