High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

1998 ◽  
Vol 72 (24) ◽  
pp. 3115-3117 ◽  
Author(s):  
J. A. Veerman ◽  
A. M. Otter ◽  
L. Kuipers ◽  
N. F. van Hulst
Keyword(s):  
Optical Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Near Field ◽  
High Definition ◽  
Focused Ion Beam Milling

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

2001 ◽  
Vol 57-58 ◽  
pp. 721-728 ◽  
Author(s):  
C. Lehrer ◽  
L. Frey ◽  
S. Petersen ◽  
Th. Sulzbach ◽  
O. Ohlsson ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Near Field

scholarly journals Fabrication of probes for scanning near-field optical microscopy using focused ion beam

2018 ◽  
Vol 443 ◽  
pp. 012015 ◽  
Author(s):  
A S Kolomiytsev ◽  
N A Shandyba ◽  
I V Panchenko ◽  
S A Lisitsyn
Keyword(s):  
Optical Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Near Field

Focused ion-beam fabrication of fiber probes with well-defined apertures for use in near-field scanning optical microscopy

1998 ◽  
Vol 72 (24) ◽  
pp. 3133-3135 ◽  
Author(s):  
Saeed Pilevar ◽  
Klaus Edinger ◽  
Walid Atia ◽  
Igor Smolyaninov ◽  
Christopher Davis
Keyword(s):  
Optical Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Near Field ◽  
Fiber Probes ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Control of Aperture Size of Optical Probes for Scanning Near-Field Optical Microscopy Using Focused Ion Beam Technology

1997 ◽  
Vol 36 (Part 2, No. 7B) ◽  
pp. L942-L944 ◽  
Author(s):  
Masaru Muranishi ◽  
Kazutaka Sato ◽  
Sumio Hosaka ◽  
Atsushi Kikukawa ◽  
Toshimichi Shintani ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Near Field ◽  
Aperture Size ◽  
Optical Probes

scholarly journals A streamlined workflow for automated cryo focused ion beam milling

2021 ◽  
pp. 107743
Author(s):  
Sebastian Tacke ◽  
Philipp Erdmann ◽  
Zhexin Wang ◽  
Sven Klumpe ◽  
Michael Grange ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

Addressable Metal-Ferroelectric-Metal Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2012 ◽  
Vol 132 (1) ◽  
pp. 99-106
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Bin Tian ◽  
Lianying Zou ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

A study of angular effects in focused ion beam milling of water ice

2008 ◽  
Vol 18 (9) ◽  
pp. 095010 ◽  
Author(s):  
Jing Fu ◽  
Sanjay B Joshi ◽  
Jeffrey M Catchmark
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Water Ice ◽  
Focused Ion Beam Milling
Sign in / Sign up

Export Citation Format

Share Document