In situ infrared ellipsometry study of hydrogenated amorphous carbon/Si interface formation
1998 ◽
Vol 227-230
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pp. 636-640
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2020 ◽
Vol 9
(2)
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pp. 1698-1707
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1999 ◽
Vol 16
(7)
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pp. 1044
1992 ◽
Vol 279
(1-2)
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pp. A105
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1999 ◽
Vol 111
(6)
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pp. 293-298
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