X-ray photoelectron spectroscopy study of excimer laser treated alumina films

1998 ◽  
Vol 72 (1) ◽  
pp. 31-33 ◽  
Author(s):  
D. G. Georgiev ◽  
K. Kolev ◽  
L. D. Laude ◽  
B. Mednikarov ◽  
N. Starbov
Keyword(s):  
Excimer Laser ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Alumina Films

X-ray diffraction and x-ray photoelectron spectroscopy study of partially strained SiGe layers produced via excimer laser processing

1997 ◽  
Vol 82 (1) ◽  
pp. 147-154 ◽  
Author(s):  
S. Martelli ◽  
I. Vianey ◽  
R. Larciprete ◽  
E. Borsella ◽  
J. Castro ◽  
...  
Keyword(s):  
Excimer Laser ◽  
Photoelectron Spectroscopy ◽  
Laser Processing ◽  
Spectroscopy Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Strained Sige

Oxidation of Si(100) in nitric oxide at low pressures: An x-ray photoelectron spectroscopy study

1997 ◽  
Vol 70 (1) ◽  
pp. 63-65 ◽  
Author(s):  
A. Kamath ◽  
D. L. Kwong ◽  
Y. M. Sun ◽  
P. M. Blass ◽  
S. Whaley ◽  
...  
Keyword(s):  
Nitric Oxide ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Low Pressures
Sign in / Sign up

Export Citation Format

Share Document