Removal of thin layer for trace element analysis of solid surface in subnanometer scale using laser-ablation atomic fluorescence spectroscopy

1997 ◽  
Vol 71 (20) ◽  
pp. 2916-2918 ◽  
Author(s):  
Yuji Oki ◽  
Kenji Matsunaga ◽  
Takumi Nomura ◽  
Mitsuo Maeda
2017 ◽  
Author(s):  
Amy K. Plechacek ◽  
◽  
Madeline E. Schreiber ◽  
John A. Chermak ◽  
Tracy L. Bank

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