scholarly journals Pulsed laser deposition of Cu:Al2O3 nanocrystal thin films with high third-order optical susceptibility

1997 ◽  
Vol 71 (17) ◽  
pp. 2445-2447 ◽  
Author(s):  
J. M. Ballesteros ◽  
R. Serna ◽  
J. Solı́s ◽  
C. N. Afonso ◽  
A. K. Petford-Long ◽  
...  
2001 ◽  
Vol 18 (12) ◽  
pp. 1598-1600 ◽  
Author(s):  
Yang Guang ◽  
Wang Huan-Hua ◽  
Tan Guo-Tai ◽  
Jiang An-Quan ◽  
Zhou Yue-Liang ◽  
...  

2016 ◽  
Vol 60 ◽  
pp. 123-127 ◽  
Author(s):  
S.A. Mulenko ◽  
V.I. Rudenko ◽  
V.R. Liakhovetskyi ◽  
A.M. Brodin ◽  
N. Stefan

2007 ◽  
Vol 61 (17) ◽  
pp. 3701-3704 ◽  
Author(s):  
Kansong Chen ◽  
Haoshuang Gu ◽  
Jiansan Zou ◽  
Wang Li ◽  
Huang Yi

2011 ◽  
Vol 181-182 ◽  
pp. 212-219
Author(s):  
Zhi Cheng Zhong ◽  
Shao Hua Qu ◽  
Xiang Dong Ji ◽  
Jie Bo Hu ◽  
Duan Ming Zhang

Perovskite KTa0.65Nb0.35O3 (KTN) thin films were grown by pulsed laser deposition (PLD) on single crystal SrTiO3 (100) substrates. X-ray diffraction (XRD) analyses illustrate epitaxially grown of KTN thin films along the (100) orientation. The surface morphology of films observed by atomic force microscope (AFM) showed that, the surface of films was smooth and uniform built from regular, ordered and dense grains with the root mean square (RMS) roughness of 5.602 nm. Linear and third-order nonlinear optical properties of the films were investigated by using transmission spectra as well as the Z-scan technique with femtosecond laser pulses, respectively. The open-aperture and closed-aperture Z-scan curves of KTN thin films were obtained in the first measurement. The calculated nonlinear refractive index was , the nonlinear absorption coefficient is = , and the real part and imaginary part of the third order nonlinear susceptibility are and respectively.


1999 ◽  
Vol 75 (7) ◽  
pp. 902-904 ◽  
Author(s):  
W. F. Zhang ◽  
M. S. Zhang ◽  
Z. Yin ◽  
Y. Z. Gu ◽  
Z. L. Du ◽  
...  

2001 ◽  
Vol 11 (PR11) ◽  
pp. Pr11-65-Pr11-69
Author(s):  
N. Lemée ◽  
H. Bouyanfif ◽  
J. L. Dellis ◽  
M. El Marssi ◽  
M. G. Karkut ◽  
...  

2001 ◽  
Vol 11 (PR11) ◽  
pp. Pr11-133-Pr11-137
Author(s):  
J. R. Duclère ◽  
M. Guilloux-Viry ◽  
A. Perrin ◽  
A. Dauscher ◽  
S. Weber ◽  
...  

2002 ◽  
Vol 720 ◽  
Author(s):  
Costas G. Fountzoulas ◽  
Daniel M. Potrepka ◽  
Steven C. Tidrow

AbstractFerroelectrics are multicomponent materials with a wealth of interesting and useful properties, such as piezoelectricity. The dielectric constant of the BSTO ferroelectrics can be changed by applying an electric field. Variable dielectric constant results in a change in phase velocity in the device allowing it to be tuned in real time for a particular application. The microstructure of the film influences the electronic properties which in turn influences the performance of the film. Ba0.6Sr0.4Ti1-y(A 3+, B5+)yO3 thin films, of nominal thickness of 0.65 μm, were synthesized initially at substrate temperatures of 400°C, and subsequently annealed to 750°C, on LaAlO3 (100) substrates, previously coated with LaSrCoO conductive buffer layer, using the pulsed laser deposition technique. The microstructural and physical characteristics of the postannealed thin films have been studied using x-ray diffraction, scanning electron microscopy, and nano indentation and are reported. Results of capacitance measurements are used to obtain dielectric constant and tunability in the paraelectric (T>Tc) regime.


Sign in / Sign up

Export Citation Format

Share Document