scholarly journals High resolution imaging of thin-film recording heads by superparamagnetic magnetic force microscopy tips

1997 ◽  
Vol 70 (1) ◽  
pp. 135-137 ◽  
Author(s):  
S. H. Liou ◽  
S. S. Malhotra ◽  
John Moreland ◽  
P. F. Hopkins
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
High Resolution Imaging ◽  
Force Microscopy ◽  
Recording Heads ◽  
Resolution Imaging

A comparison of domain images obtained for nanophase alloys by magnetic force microscopy and high resolution Lorentz electron microscopy

1995 ◽  
Vol 31 (6) ◽  
pp. 3349-3351 ◽  
Author(s):  
M.R.J. Gibbs ◽  
M.A. Al-Khafaji ◽  
W.M. Rainforth ◽  
H.A. Davies ◽  
K. Babcock ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

scholarly journals High resolution magnetic force microscopy using focused ion beam modified tips

2002 ◽  
Vol 81 (5) ◽  
pp. 865-867 ◽  
Author(s):  
G. N. Phillips ◽  
M. Siekman ◽  
L. Abelmann ◽  
J. C. Lodder
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy

dc magnetic force microscopy imaging of thin‐film recording head

1994 ◽  
Vol 75 (10) ◽  
pp. 6878-6880 ◽  
Author(s):  
Paul Rice ◽  
John Moreland ◽  
Andrzej Wadas
Keyword(s):  
Thin Film ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Microscopy Imaging ◽  
Recording Head ◽  
Force Microscopy
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