Erratum: “An investigation on the leakage current and time dependent dielectric breakdown of ferroelectric lead–zirconate–titanate thin film capacitors for memory device applications” [Appl. Phys. Lett. 69, 4011 (1996)]

1997 ◽  
Vol 70 (8) ◽  
pp. 1058-1058
Author(s):  
Jia-lin Chen ◽  
Hong-ming Chen ◽  
Joseph Ya-min Lee
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Dielectric Breakdown ◽  
Memory Device ◽  
Lead Zirconate ◽  
Time Dependent ◽  
Time Dependent Dielectric Breakdown ◽  
Thin Film Capacitors ◽  
Device Applications ◽  
Titanate Thin Film

Effects of Thermal Annealing on Lead Zirconate Titanate Thin Film Capacitors with Platinum Electrodes

2007 ◽  
Vol 154 (11) ◽  
pp. G251 ◽  
Author(s):  
Jiang-Li Cao ◽  
Axel Solbach ◽  
Yan Fang ◽  
Ulrich Boettger ◽  
Peter J. Schorn ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Annealing ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Platinum Electrodes ◽  
Zirconate Titanate ◽  
Thin Film Capacitors ◽  
Titanate Thin Film

Cavity origin and influence on reliability in lead zirconate titanate thin film capacitors

2009 ◽  
Vol 106 (5) ◽  
pp. 054108 ◽  
Author(s):  
Mohamed-Tahar Chentir ◽  
Laurent Ventura ◽  
Émilien Bouyssou ◽  
Christine Anceau
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Zirconate Titanate ◽  
Thin Film Capacitors ◽  
Titanate Thin Film
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