Simultaneous determination of the strain/stress tensor and the unstrained lattice constants by x‐ray diffraction

1996 ◽  
Vol 69 (17) ◽  
pp. 2495-2497 ◽  
Author(s):  
Thomas Wieder
Keyword(s):  
Stress Tensor ◽  
Simultaneous Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Strain Stress

Absolute Präzisionsbestimmung von Gitterkonstanten an Germanium- und Aluminium-Einkristallen mit Elektroneninterferenzen

1967 ◽  
Vol 22 (1) ◽  
pp. 92-95 ◽  
Author(s):  
W. Witt
Keyword(s):  
Electron Diffraction ◽  
Lattice Constant ◽  
Bulk Material ◽  
X Ray Diffraction ◽  
Full Agreement ◽  
X Ray ◽  
Lattice Constants ◽  
Precision Determination ◽  
Subsequent Chemical

An absolute precision determination of lattice constants by electron diffraction is made with thin monocrystalline films of germanium and aluminium, having a thickness between 1000 and 5000 A. The films are prepared from the bulk material by mechanical polishing and subsequent chemical polishing or etching. The obtained values for the lattice constant α of both materials are within the accuracy Δα/α= ±3·10-5 of measurement in full agreement with the corresponding values obtained by X-ray diffraction (Smakula and Kalnajs).

scholarly journals Preparation of Electrochemical Sensor Based on Zinc Oxide Nanoparticles for Simultaneous Determination of AA, DA, and UA

2020 ◽  
Vol 8 ◽  
Author(s):  
Yuanzhi Pan ◽  
Junli Zuo ◽  
Zhongyu Hou ◽  
Yizhong Huang ◽  
Cancan Huang
Keyword(s):  
Electrochemical Sensor ◽  
Simultaneous Determination ◽  
Modified Electrode ◽  
Zinc Oxide Nanoparticles ◽  
Clinical Applications ◽  
X Ray Diffraction ◽  
Modified Glassy Carbon Electrode ◽  
Zno Nps ◽  
X Ray

ZnO nanoparticles (NPs) were synthesized using a hydrothermal method. Scanning electron microscope (SEM) and X-ray diffraction have been used for characterizing the synthesized ZnO NPs. An electrochemical sensor was fabricated using ZnO NPs–modified glassy carbon electrode for simultaneous determination of ascorbic acid (AA), dopamine (DA), and uric acid (UA). The proposed electrochemical sensor exhibited excellent detection performance toward three analytes, demonstrating that it can potentially be applied in clinical applications. The results indicated the ZnO NPs–modified electrode can detect AA in the concentrations range between 50 and 1,000 μM. The ZnO NPs–modified electrode can detect DA in the concentrations range between 2 and 150 μM. The ZnO NPs–modified electrode can detect UA in the concentrations range between 0.2 and 150 μM. The limits of detections of AA, DA, and UA using ZnO NPs–modified electrode were calculated to be 18.4, 0.75, and 0.11 μM, respectively.

Determination of the residual stress tensor in Cu/W multilayers by x‐ray diffraction

1993 ◽  
Vol 62 (3) ◽  
pp. 246-248 ◽  
Author(s):  
Ph. Goudeau ◽  
K. F. Badawi ◽  
A. Naudon ◽  
G. Gladyszewski
Keyword(s):  
Residual Stress ◽  
Stress Tensor ◽  
X Ray Diffraction ◽  
X Ray

Variation of cation distribution with temperature and its consequences on thermal expansion for Ca3Eu2(BO3)4

2020 ◽  
Vol 76 (4) ◽  
pp. 554-562
Author(s):  
Katarzyna M. Kosyl ◽  
Wojciech Paszkowicz ◽  
Alexey N. Shekhovtsov ◽  
Miron B. Kosmyna ◽  
Jerzy Antonowicz ◽  
...  
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
High Resolution ◽  
Ambient Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Thermal Expansion Anisotropy ◽  
Structural Details

The structure of calcium europium orthoborate, Ca3Eu2(BO3)4, was determined using high-resolution powder X-ray diffraction data collected at the ID22 beamline (ESRF) under ambient conditions, as well as at high temperature. Rietveld refinement allowed determination of the lattice constants and structural details, including the Ca/Eu ratios at the three cationic sites and their evolution with temperature. Clear thermal expansion anisotropy was found, and slope changes of lattice-constant dependencies on temperature were observed at 923 K. Above this temperature the changes in occupation of the Ca/Eu sites occur, exhibiting a tendency towards a more uniform Eu distribution over the three Ca/Eu sites. Possible structural origins of the observed thermal expansion anisotropy are discussed.

scholarly journals Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

2012 ◽  
Vol 45 (2) ◽  
pp. 367-370 ◽  
Author(s):  
Markus Neuschitzer ◽  
Armin Moser ◽  
Alfred Neuhold ◽  
Johanna Kraxner ◽  
Barbara Stadlober ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Organic Films ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
X Ray ◽  
Lattice Constants ◽  
Thin Organic Films ◽  
Position Sensitive

A novel grazing-incidence in-plane X-ray diffraction setup based on a commercial four-circle diffractometer with a sealed-ceramic copper X-ray tube, upgraded with parabolic graded multilayer X-ray optics and a one-dimensional position-sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in-plane lattice constants of pentacene mono- and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.

Simultaneous determination of tensile and shear strains of crystalline bilayers using three Bragg reflections of X-rays

2016 ◽  
Vol 49 (4) ◽  
pp. 1203-1208
Author(s):  
Yan-Zong Zheng ◽  
Ting-Wei Wu ◽  
Lien-Kuang Yu ◽  
Yong-Cheng Wei ◽  
Wen-Chung Liu ◽  
...  
Keyword(s):  
Simultaneous Determination ◽  
Tensile Strain ◽  
Diffraction Peak ◽  
X Rays ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
X Ray ◽  
Theoretical Considerations ◽  
Gesi Layer

A method for the simultaneous determination of nine strain coefficients, both shear and tensile, of crystalline bilayers is proposed and realized. The X-ray diffraction peak intensities along 2θ (vertical) and β (horizontal) scans relative to the plane of incidence of three Bragg reflections whose atomic planes are not parallel to each other can be used to obtain shear and tensile strain coefficients. The theoretical considerations and experimental examples for single-crystal GeSi/Si overlayers are reported. It is also demonstrated that, for GeSi/Si, the shear and tensile strain coefficients of the Si substrate tend to vanish when the GeSi layer is thicker than 40 nm.

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