Structures and defects induced during annealing of sputtered near‐equiatomic NiTi shape memory thin films

1996 ◽  
Vol 69 (18) ◽  
pp. 2656-2658 ◽  
Author(s):  
F. F. Gong ◽  
H. M. Shen ◽  
Y. N. Wang
Keyword(s):  
2003 ◽  
Vol 112 ◽  
pp. 853-856 ◽  
Author(s):  
D. S. Grummon ◽  
T. LaGrange
Keyword(s):  

2008 ◽  
Vol 202 (13) ◽  
pp. 3115-3120 ◽  
Author(s):  
A.J. Muir Wood ◽  
S. Sanjabi ◽  
Y.Q. Fu ◽  
Z.H. Barber ◽  
T.W. Clyne

2005 ◽  
Vol 14 (5) ◽  
pp. S216-S222 ◽  
Author(s):  
Akira Ishida ◽  
Morio Sato ◽  
Osamu Tabata ◽  
Wataru Yoshikawa

2008 ◽  
Vol 14 (S3) ◽  
pp. 85-86
Author(s):  
R.M.S. Martins ◽  
A. Mücklich ◽  
N. Schell ◽  
R.J.C. Silva ◽  
K.K. Mahesh ◽  
...  

Ni-Ti Shape Memory Alloys (SMAs) have been attracting attention as smart materials because they can work as sensors and actuators at the same time. Miniaturization of mechanical devices is evolving toward sub-micron dimensions raising important questions in the properties of Ni-Ti films. In thin films it is essential to investigate the microstructure to understand the origin of the thickness limit. The design of functionally graded films has also been considered but for their successful development it is important to characterize the variations in crystalline structure.


1999 ◽  
Vol 342 (1-2) ◽  
pp. 67-73 ◽  
Author(s):  
Florent Goldberg ◽  
Émile J. Knystautas

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