Asymmetric, reflection mode nonlinear Fabry–Perot modulator using bacteriorhodopsin

De Yu Zang; James E. Millerd; Daniel Smithey

doi:10.1063/1.116809

Asymmetric, reflection mode nonlinear Fabry–Perot modulator using bacteriorhodopsin

Applied Physics Letters ◽

10.1063/1.116809 ◽

1996 ◽

Vol 69 (21) ◽

pp. 3143-3145 ◽

Cited By ~ 6

Author(s):

De Yu Zang ◽

James E. Millerd ◽

Daniel Smithey

Keyword(s):

Reflection Mode ◽

Asymmetric Reflection ◽

Fabry Perot

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Thermally-actuated reflection mode asymmetric Fabry–Perot modulator utilizing a thin transparent elastomeric film

Applied Physics Letters ◽

10.1063/1.121233 ◽

1998 ◽

Vol 72 (16) ◽

pp. 1951-1953 ◽

Cited By ~ 9

Author(s):

John A. Rogers ◽

Olivier J. A. Schueller ◽

George M. Whitesides

Keyword(s):

Reflection Mode ◽

Fabry Perot ◽

Thermally Actuated

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The Assessment of Surface Coatings Using Laser Ultrasound Detected with a Wideband Confocal Fabry-Pérot Interferometer Operating in Reflection Mode

Review of Progress in Quantitative Nondestructive Evaluation ◽

10.1007/978-1-4615-5947-4_205 ◽

1997 ◽

pp. 1571-1578

Author(s):

A. S. Bradford ◽

Q. Shan ◽

R. J. Dewhurst

Keyword(s):

Surface Coatings ◽

Laser Ultrasound ◽

Reflection Mode ◽

Fabry Perot

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Beam‐switching of Fabry–Perot cavity antenna using asymmetric reflection phase response of bianisotropic metasurface

IET Microwaves Antennas & Propagation ◽

10.1049/iet-map.2018.5529 ◽

2019 ◽

Vol 13 (6) ◽

pp. 842-848 ◽

Cited By ~ 1

Author(s):

Kranti Kumar Katare ◽

Sandhya Chandravanshi ◽

Animesh Biswas ◽

Mohammad Jaleel Akhtar

Keyword(s):

Phase Response ◽

Reflection Phase ◽

Asymmetric Reflection ◽

Fabry Perot ◽

Beam Switching

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Simultaneous measurement of refractive index and temperature based on a reflection-mode long-period grating and an intrinsic Fabry–Perot interferometer sensor

Optics Letters ◽

10.1364/ol.30.003000 ◽

2005 ◽

Vol 30 (22) ◽

pp. 3000 ◽

Cited By ~ 85

Author(s):

Dae Woong Kim ◽

Fabin Shen ◽

Xiaopei Chen ◽

Anbo Wang

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Reflection Mode ◽

Long Period Grating ◽

Long Period ◽

Fabry Perot

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An improved design for an Scanning Tunnelling Microscope (STM) for use in a Transmission Electron Microscope (TEM)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086222 ◽

1991 ◽

Vol 49 ◽

pp. 384-385

Author(s):

W.K. Lo ◽

J.C.H. Spence

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Mechanical Stability ◽

Scanning Tunnelling Microscope ◽

Reflection Mode ◽

Specimen Holder ◽

Transmission Electron ◽

Scanning Tunnelling ◽

Improved Design

An improved design for a combination Scanning Tunnelling Microscope/TEM specimen holder is presented. It is based on earlier versions which have been used to test the usefulness of such a device. As with the earlier versions, this holder is meant to replace the standard double-tilt specimen holder of an unmodified Philips 400T TEM. It allows the sample to be imaged simultaneously by both the STM and the TEM when the TEM is operated in the reflection mode (see figure 1).The resolution of a STM is determined by its tip radii as well as its stability. This places strict limitations on the mechanical stability of the tip with respect to the sample. In this STM the piezoelectric tube scanner is rigidly mounted inside the endcap of the STM holder. The tip coarse approach to the sample (z-direction) is provided by an Inchworm which is located outside the TEM vacuum.

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