Atomic force microscopy and photoluminescence study of Ge layers and self‐organized Ge quantum dots on Si(100)

1996 ◽  
Vol 68 (21) ◽  
pp. 2982-2984 ◽  
Author(s):  
E. Palange ◽  
G. Capellini ◽  
L. Di Gaspare ◽  
F. Evangelisti
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Photoluminescence Study ◽  
Force Microscopy ◽  
Self Organized ◽  
Atomic Force ◽  
Ge Quantum Dots

Mechanism of the Preferential Edge-Positioning of Self-Organized Ge Quantum Dots on Si Mesas

1999 ◽  
Vol 571 ◽  
Author(s):  
G. Jin ◽  
Y.S. Tang ◽  
J.L. Liu ◽  
S.G. Thomas ◽  
K.L. Wang
Keyword(s):  
Quantum Dots ◽  
Field Distribution ◽  
Strain Field ◽  
Compressive Strain ◽  
Raman Spectroscopic ◽  
Force Microscopy ◽  
Self Organized ◽  
Gas Source ◽  
Atomic Force ◽  
Ge Quantum Dots

ABSTRACTWe have investigated the preferential positioning of self-organized Ge quantum dots on Si (001) mesas fabricated in a selective epitaxial growth (SEG) mode of gas-source molecular beam epitaxy. The surface morphology was evaluated by atomic force microscopy, and for the Si SEG structures, showed mass accumulation at the periphery. Using micro-Raman spectroscopic imaging, the strain-field distribution of Si structures was studied before Ge deposition, and the results suggest a tensile strain at/near the periphery of the structure while a compressive strain at the center. These structures were subsequently used as a template for Ge dots, which tended to align along the mesa edge. The strain field distribution on Si mesas is speculated to be the driving force for preferential nucleation of Ge dots.

Studying the lateral composition in Ge quantum dots on Si(001) by conductive atomic force microscopy

2005 ◽  
Vol 592 (1-3) ◽  
pp. 65-71 ◽  
Author(s):  
F. Xue ◽  
J. Qin ◽  
J. Cui ◽  
Y.L. Fan ◽  
Z.M. Jiang ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ge Quantum Dots

Kinetics of the evolution of InAs/GaAs quantum dots to quantum rings: A combined x-ray, atomic force microscopy, and photoluminescence study

2009 ◽  
Vol 80 (15) ◽  
Author(s):  
Vikas Baranwal ◽  
Giorgio Biasiol ◽  
Stefan Heun ◽  
Andrea Locatelli ◽  
Tevfik Onur Mentes ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Quantum Rings ◽  
Photoluminescence Study ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Kinetics Of

Growth and characterization of InAs quantum dots on GaAs (100) emitting at 1.31μm.

2003 ◽  
Vol 794 ◽  
Author(s):  
V. Celibert ◽  
B. Salem ◽  
G. Guillot ◽  
C. Bru-Chevallier ◽  
L. Grenouillet ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Excitation Power ◽  
Good Growth ◽  
Excitation Power Density ◽  
Inas Quantum Dots ◽  
Force Microscopy ◽  
Self Organized ◽  
Gas Source ◽  
Atomic Force ◽  
Layer Deposition

ABSTRACTSelf-organized InAs quantum dots (QDs) were grown in the Stranski-Krastanov regime, by gas-source molecular beam epitaxy (GSMBE), on (100) GaAs substrates. Two important parameters have been optimized in order to grow high quality QDs with a very good reproducibility: InAs growth rate and GaAs cap layer deposition rate. Atomic force microscopy (AFM) analysis shows a unimodal QD distribution and the room temperature photoluminescence (RTPL) spectrum of the optimized sample reveals a 1.3 μm emission with a 19 meV full width at half maximum (FWHM). Photoluminescence (PL) measurements versus excitation power density and photoluminescence excitation (PLE) measurements clearly show multi-component PL emission from transitions associated with fundamental and related excited states of QDs. Furthermore a good growth reproducibility is observed. The results are promising for further work which will lead to laser fabrication.

Atomic Force Microscopy Studies of DNA-Wrapped Carbon Nanotube Structure and Binding to Quantum Dots

2008 ◽  
Vol 130 (32) ◽  
pp. 10648-10655 ◽  
Author(s):  
Jennifer F. Campbell ◽  
Ingrid Tessmer ◽  
H. Holden Thorp ◽  
Dorothy A. Erie
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document