Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films
Keyword(s):
X Ray
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2013 ◽
Vol 114
(12)
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pp. 1069-1073
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2008 ◽
Vol 99
(11)
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pp. 1248-1255
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Keyword(s):
1999 ◽
Vol 55
(11)
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pp. 1914-1916
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