Design, fabrication, and test of wide‐angle low‐loss Y‐junction hybrid polymer couplers

Tsang‐Der Ni; Dana Sturzebecher; Mike Cummings; Barry Perlman

doi:10.1063/1.115045

Design, fabrication, and test of wide‐angle low‐loss Y‐junction hybrid polymer couplers

Applied Physics Letters ◽

10.1063/1.115045 ◽

1995 ◽

Vol 67 (12) ◽

pp. 1651-1652 ◽

Cited By ~ 7

Author(s):

Tsang‐Der Ni ◽

Dana Sturzebecher ◽

Mike Cummings ◽

Barry Perlman

Keyword(s):

Wide Angle ◽

Hybrid Polymer ◽

Low Loss

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Low-loss, wide-angle Y splitter at ∼16-µm wavelengths built with a two-dimensional photonic crystal

Optics Letters ◽

10.1364/ol.27.001400 ◽

2002 ◽

Vol 27 (16) ◽

pp. 1400 ◽

Cited By ~ 76

Author(s):

S. Y. Lin ◽

E. Chow ◽

J. Bur ◽

S. G. Johnson ◽

J. D. Joannopoulos

Keyword(s):

Photonic Crystal ◽

Wide Angle ◽

Two Dimensional ◽

Low Loss ◽

Dimensional Photonic Crystal ◽

Two Dimensional Photonic Crystal

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Novel design of a wide-angle low-loss Y-junction waveguide

10.1117/12.391465 ◽

2000 ◽

Author(s):

Wen-Ching Chang ◽

Han-Bin Lin ◽

Kuo C. Wei ◽

Li-Ying Chang

Keyword(s):

Wide Angle ◽

Low Loss ◽

Novel Design

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Low-loss wide-angle Y-branch optical waveguides

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/ecjb.20122 ◽

2005 ◽

Vol 88 (2) ◽

pp. 11-18

Author(s):

Tetsuro Yabu ◽

Masahiro Geshiro ◽

Masaharu Ohashi

Keyword(s):

Optical Waveguides ◽

Wide Angle ◽

Low Loss

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Microprism for Wide-Angle Low-Loss Y-Junction Waveguide

Fiber & Integrated Optics ◽

10.1080/014680398244948 ◽

1998 ◽

Vol 17 (3) ◽

pp. 213-219 ◽

Cited By ~ 1

Author(s):

CHING-TING LEE MOUNT-LEARN WU

Keyword(s):

Wide Angle ◽

Low Loss

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Low-loss electron image in the sem

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100073982 ◽

1983 ◽

Vol 41 ◽

pp. 2-5

Author(s):

Oliver C. Wells

Keyword(s):

Electron Microscope ◽

Solid Angle ◽

Primary Energy ◽

Wide Angle ◽

Low Loss ◽

Backscattered Electrons ◽

Electron Image ◽

Takeoff Angle ◽

Scintillator Detector ◽

Scanning Electron

The idea of filtering the backscattered electrons (BSE) in the scanning electron microscope (SEM) in order to improve the spatial resolution was suggested by McMullan (1953a) as follows: “...the beam from the specimen could be restricted to the electrons which have lost only small amounts of energy and which have therefore travelled only short distances through the specimen.” BSE which have lost less than about 1% of the primary energy can be called “low-loss electrons” or LLE (Wells 1971). As compared with LLE, the reflected electron peak contains electrons that have lost essentially no energy (Seiler 1983).Data on BSE and LLE from solid targets was given by Kanter (1957) and by Wolf, Coane and Everhart (1970). The wide-angle scintillator detector for BSE (in which the scintillator subtends a large solid angle at the specimen) was investigated by Smith (1956) and by Everhart (1958). The importance of the takeoff angle with this detector was shown experimentally by Wells (1957 and 1970).

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