Dynamics of a piezoelectric tuning fork/optical fiber assembly in a near-field scanning optical microscope

2000 ◽  
Vol 71 (2) ◽  
pp. 437-443 ◽  
Author(s):  
Konstantin B. Shelimov ◽  
Dmitri N. Davydov ◽  
Martin Moskovits
Keyword(s):  
Optical Fiber ◽  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Fiber Assembly ◽  
Near Field Scanning

scholarly journals A Tapping-Mode Tuning Fork with a Short Fibre Probe Sensor for a Near-Field Scanning Optical Microscope

2002 ◽  
Vol 19 (9) ◽  
pp. 1268-1270 ◽  
Author(s):  
Wang Pei ◽  
Lu Yong-Hua ◽  
Zhang Jiang-Ying ◽  
Ming Hai ◽  
Xie Jian-Ping ◽  
...  
Keyword(s):  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Short Fibre ◽  
Tapping Mode ◽  
Fibre Probe ◽  
Near Field Scanning ◽  
Probe Sensor

Extending the Possibilities of Near-Field Scanning Optical Microscopy for Simultaneous Topographical and Chemical Force Imaging

1999 ◽  
Vol 584 ◽  
Author(s):  
N. Nagy ◽  
M. C. Goh
Keyword(s):  
Optical Fiber ◽  
Optical Fibers ◽  
Microcontact Printing ◽  
Near Field ◽  
Optical Microscope ◽  
Optical Probe ◽  
Germanium Dioxide ◽  
Fiber Optic Probe ◽  
Pure Silica ◽  
Near Field Scanning

AbstractThe Near-field Scanning Optical Microscope (NSOM) is an innovative new form of surface microscopy, which can be used to obtain local spectroscopic information about surfaces, enabling the characterization of nanometer-sized regions. The most important component of this instrument is the scanning probe tip. In this paper, we discuss the production of a novel fiber optic probe that can be used in local spectroscopy with an NSOM, but also for simultaneous imaging of topography and chemical forces. The probe consists of a bent, tapered silicon dioxide optical fiber. We have determined the rates of selective wet chemical etching of germanium dioxide doped pure silica optical fibers and used this information to optimize the probe etching process. A systematic approach for the development and testing of such probes is presented. The performance of the optical probes was characterized using surfaces prepared by the technique of microcontact printing. Phase and friction images of these surfaces were obtained using both standard atomic force microscopy tips and the optical fiber probe. The new optical probe was capable of distinguishing between different chemical regions on the patterned surface.

DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE

2003 ◽  
Vol 02 (04n05) ◽  
pp. 225-230
Author(s):  
CHIEN-WEN HUANG ◽  
NIEN-HUA LU ◽  
CHIH-YEN CHEN ◽  
CHENG-FENG YU ◽  
TSUNG-SHENG KAO ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Single Mode ◽  
Optical Microscope ◽  
Sensing Element ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Design And Construction

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.

scholarly journals Implementation of a short-tip tapping-mode tuning fork near-field scanning optical microscope

2003 ◽  
Vol 209 (3) ◽  
pp. 205-208 ◽  
Author(s):  
N. H. Lu ◽  
C. W. Huang ◽  
C. Y. Chen ◽  
C. F. Yu ◽  
T. S. Kao ◽  
...  
Keyword(s):  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Tapping Mode ◽  
Near Field Scanning

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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