Second harmonic generation and atomic‐force microscopy studies of porous silicon

O. A. Aktsipetrov; A. V. Melnikov; Yu. N. Moiseev; T. V. Murzina; C. W. van Hasselt; Th. Rasing; G. Rikken

doi:10.1063/1.115003

Second harmonic generation and atomic‐force microscopy studies of porous silicon

Applied Physics Letters ◽

10.1063/1.115003 ◽

1995 ◽

Vol 67 (9) ◽

pp. 1191-1193 ◽

Cited By ~ 5

Author(s):

O. A. Aktsipetrov ◽

A. V. Melnikov ◽

Yu. N. Moiseev ◽

T. V. Murzina ◽

C. W. van Hasselt ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Porous Silicon ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Second Harmonic ◽

Force Microscopy ◽

Atomic Force

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Organization and Orientation of Amphiphilic Push−Pull Chromophores Deposited in Langmuir−Blodgett Monolayers Studied by Second Harmonic Generation and Atomic Force Microscopy

Langmuir ◽

10.1021/la0491706 ◽

2004 ◽

Vol 20 (19) ◽

pp. 8165-8171 ◽

Cited By ~ 18

Author(s):

A. Leray ◽

L. Leroy ◽

Y. Le Grand ◽

C. Odin ◽

A. Renault ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Second Harmonic ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force

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Second harmonic generation and scanning tunnelling/atomic-force microscopy studies of tungsten-doped, amorphous-carbon films

Thin Solid Films ◽

10.1016/s0040-6090(97)00149-1 ◽

1997 ◽

Vol 305 (1-2) ◽

pp. 341-344 ◽

Cited By ~ 2

Author(s):

O.A. Aktsipetrov ◽

V.F. Dorfman ◽

E.D. Mishina ◽

T.V. Murzina ◽

Yu.N. Moiseev ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Amorphous Carbon ◽

Second Harmonic ◽

Carbon Films ◽

Amorphous Carbon Films ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling

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Response to comment on “Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): new approaches to oxide surface charge”

Geochimica et Cosmochimica Acta ◽

10.1016/s0016-7037(02)01033-5 ◽

2003 ◽

Vol 67 (2) ◽

pp. 321-322 ◽

Cited By ~ 6

Author(s):

Andrew G. Stack ◽

Steven R. Higgins ◽

Carrick M. Eggleston

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Surface Charge ◽

Harmonic Generation ◽

Second Harmonic ◽

Point Of Zero Charge ◽

Oxide Surface ◽

Water Interface ◽

Force Microscopy ◽

Atomic Force

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Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection

Applied Spectroscopy ◽

10.1366/000370210790572070 ◽

2010 ◽

Vol 64 (1) ◽

pp. 1-7 ◽

Cited By ~ 9

Author(s):

Kent A. Meyer ◽

Kin C. Ng ◽

Zhanjun Gu ◽

Zhengwei Pan ◽

William B. Whitten ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Limit Of Detection ◽

Second Harmonic ◽

Near Field ◽

Microscopy Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Imaging

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Comment on “Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): new approaches to oxide surface charge” by A. G. Stack, S. R. Higgins, and C. M. Eggleston

Geochimica et Cosmochimica Acta ◽

10.1016/s0016-7037(02)01034-7 ◽

2003 ◽

Vol 67 (2) ◽

pp. 319-320 ◽

Cited By ~ 9

Author(s):

Marek Kosmulski

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Surface Charge ◽

Harmonic Generation ◽

Second Harmonic ◽

Point Of Zero Charge ◽

Oxide Surface ◽

Water Interface ◽

Force Microscopy ◽

Atomic Force

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Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): New approaches to oxide surface charge

Geochimica et Cosmochimica Acta ◽

10.1016/s0016-7037(01)00649-4 ◽

2001 ◽

Vol 65 (18) ◽

pp. 3055-3063 ◽

Cited By ~ 53

Author(s):

Andrew G. Stack ◽

Steven R. Higgins ◽

Carrick M. Eggleston

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Surface Charge ◽

Harmonic Generation ◽

Second Harmonic ◽

Point Of Zero Charge ◽

Oxide Surface ◽

Water Interface ◽

Force Microscopy ◽

Atomic Force

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Importance of Length and Sequence Order on Magnesium Binding to Surface-Bound Oligonucleotides Studied by Second Harmonic Generation and Atomic Force Microscopy

The Journal of Physical Chemistry B ◽

10.1021/jp301573g ◽

2012 ◽

Vol 116 (22) ◽

pp. 6302-6310 ◽

Cited By ~ 8

Author(s):

Joseph G. Holland ◽

Franz M. Geiger

Keyword(s):

Atomic Force Microscopy ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Second Harmonic ◽

Force Microscopy ◽

Atomic Force ◽

Magnesium Binding

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Investigation of porous silicon by Raman scattering and second-harmonic generation techniques

10.1117/12.175015 ◽

1994 ◽

Author(s):

Leonid A. Golovan ◽

Andrei V. Zoteyev ◽

Pavel K. Kashkarov ◽

Viktor Y. Timoshenko

Keyword(s):

Porous Silicon ◽

Raman Scattering ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Second Harmonic

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Giant second harmonic generation in microcavities based on porous silicon photonic crystals

JETP Letters ◽

10.1134/1.1355395 ◽

2001 ◽

Vol 73 (1) ◽

pp. 6-9 ◽

Cited By ~ 30

Author(s):

T. V. Dolgova ◽

A. I. Maidikovskii ◽

M. G. Martem’yanov ◽

G. Marovsky ◽

G. Mattei ◽

...

Keyword(s):

Porous Silicon ◽

Photonic Crystals ◽

Second Harmonic Generation ◽

Harmonic Generation ◽

Second Harmonic ◽

Silicon Photonic

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Characterization and Measurement of Elastic Modulus Based on Ultrasonic Atomic Force Microscopy for Nano-porous Silicon Oxide Film

Journal of Mechanical Engineering ◽

10.3901/jme.2018.12.109 ◽

2018 ◽

Vol 54 (12) ◽

pp. 109 ◽

Cited By ~ 1

Author(s):

Gaimei ZHANG

Keyword(s):

Atomic Force Microscopy ◽

Elastic Modulus ◽

Porous Silicon ◽

Oxide Film ◽

Silicon Oxide ◽

Silicon Oxide Film ◽

Force Microscopy ◽

Atomic Force

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