A simple modification of a commercial atomic force microscopy liquid cell for in situ imaging in organic, reactive, or air sensitive environments

1999 ◽  
Vol 70 (1) ◽  
pp. 121-124 ◽  
Author(s):  
Travis Wade ◽  
John F. Garst ◽  
John L. Stickney
Keyword(s):  
Atomic Force Microscopy ◽  
Simple Modification ◽  
Force Microscopy ◽  
Atomic Force ◽  
Liquid Cell ◽  
In Situ Imaging

scholarly journals In situ imaging of mitochondrial outer-membrane pores using atomic force microscopy

BioTechniques ◽  
2004 ◽  
Vol 37 (4) ◽  
pp. 564-573 ◽  
Author(s):  
Bradley E. Layton ◽  
AnnMarie Sastry ◽  
Christian M. Lastoskie ◽  
Martin A. Philbert ◽  
Terry J. Miller ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Outer Membrane ◽  
Mitochondrial Outer Membrane ◽  
Force Microscopy ◽  
Membrane Pores ◽  
Atomic Force ◽  
In Situ Imaging

In Situ Imaging of Detergent-Resistant Membranes by Atomic Force Microscopy

2000 ◽  
Vol 131 (1) ◽  
pp. 38-43 ◽  
Author(s):  
Marie-Cécile Giocondi ◽  
Véronique Vié ◽  
Eric Lesniewska ◽  
Jean-Pierre Goudonnet ◽  
Christian Le Grimellec
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Detergent Resistant Membranes ◽  
In Situ Imaging

In situ imaging of μm and sub-μm-sized grains in a cometary environment by atomic force microscopy

2002 ◽  
Vol 50 (3) ◽  
pp. 347-352 ◽  
Author(s):  
J. Romstedt ◽  
A. Jäckel ◽  
W. Klöck ◽  
K. Nakamura ◽  
H. Arends ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Imaging

An in Situ Study of Metal Complexation by an Immobilized Synthetic Biopolymer Using Tapping Mode Liquid Cell Atomic Force Microscopy

2001 ◽  
Vol 73 (17) ◽  
pp. 4087-4095 ◽  
Author(s):  
Thomasin C. Miller ◽  
Eun-Soo Kwak ◽  
Maury E. Howard ◽  
David A. Vanden Bout ◽  
James A. Holcombe
Keyword(s):  
Atomic Force Microscopy ◽  
Metal Complexation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
In Situ Study ◽  
Atomic Force ◽  
Liquid Cell

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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