Streaked x-ray diagnostic for Double EAGLE z-pinch radiation sources

1999 ◽  
Vol 70 (1) ◽  
pp. 569-571 ◽  
Author(s):  
B. H. Failor ◽  
C. A. Coverdale
Keyword(s):  
X Ray ◽  
Radiation Sources ◽  
Z Pinch

Soft x-ray (0.2

2004 ◽  
Vol 75 (10) ◽  
pp. 4026-4028 ◽  
Author(s):  
B. H. Failor ◽  
N. Qi ◽  
J. S. Levine ◽  
H. Sze ◽  
E. M. Gullickson
Keyword(s):  
Plasma Radiation ◽  
X Ray ◽  
Pinch Plasma ◽  
Radiation Sources ◽  
Z Pinch

Multicolor Soft X-Ray Imaging of $Z$-Pinch Radiation Sources on the Z-Machine Pulsed-Power Driver

2008 ◽  
Vol 36 (4) ◽  
pp. 1276-1277 ◽  
Author(s):  
B. Jones ◽  
C.A. Coverdale ◽  
M.G. Mazarakis
Keyword(s):  
Pulsed Power ◽  
X Ray ◽  
X Ray Imaging ◽  
Radiation Sources ◽  
Z Pinch

57Co and109Cd photon-radiation sources for X-ray fluorescence analysis

1988 ◽  
Vol 64 (2) ◽  
pp. 163-166 ◽  
Author(s):  
N. A. Konyakhin ◽  
B. V. Zatolokin ◽  
V. G. Meshcheryakov ◽  
G. V. Tyamin
Keyword(s):  
Fluorescence Analysis ◽  
Photon Radiation ◽  
X Ray ◽  
Radiation Sources

X-ray backlight imaging in Z-pinch

2012 ◽  
Vol 684 ◽  
pp. 93-96
Author(s):  
Lifeng Liu ◽  
Shali Xiao ◽  
Jiayu Qian ◽  
Xianbin Huang ◽  
Hongchun Cai
Keyword(s):  
X Ray ◽  
Z Pinch

scholarly journals X‐ray monochromator system for use with synchrotron radiation sources

1981 ◽  
Vol 52 (4) ◽  
pp. 509-516 ◽  
Author(s):  
J. A. Golovchenko ◽  
R. A. Levesque ◽  
P. L. Cowan
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
Radiation Sources

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

scholarly journals Microfocus X-ray Tubes

2021 ◽  
Vol 24 (5) ◽  
pp. 6-21
Author(s):  
V. B. Bessonov
Keyword(s):  
High Resolution ◽  
Nondestructive Testing ◽  
Target Material ◽  
Lanthanum Hexaboride ◽  
High Tech ◽  
Original Design ◽  
X Ray ◽  
Cathode Assembly ◽  
Radiation Sources ◽  
Key Features

Introduction. X-ray inspection plays a unique role among all nondestructive testing methods for products and materials due to sufficiently high resolution and high penetrability. The present study is designed to consider the key features of microfocus X-ray sources, their areas of application, and main technical characteristics.Aim. The paper aims to systematize information and review modern X-ray radiation sources for the implementation of microfocus radiography.Materials and methods. The main designs of microfocus X-ray tubes (soldered and demountable) were considered relying on the experience of the St Petersburg State Electrotechnical University in developing and operating such equipment, as well as the experience and open-access publications of foreign researchers and developers. Data collected by leading research teams over the last ten years were analyzed.Results. The paper presents design features for each main type of microfocus X-ray tubes – soldered and demountable. All key structural elements are considered: an anode assembly, a cathode assembly, and a focusing system. The influence of anode target material on the X-ray tube radiation spectrum is shown. An original design of a liquid-anode microfocus X-ray tube is described to demonstrate its key features and advantages. In addition, the paper gives an overview of cathodes used in microfocus X-ray tubes (tungsten cathode and lanthanum hexaboride cathode), as well as providing a detailed description of calculations performed for focusing systems. Finally, the designs of modern X-ray tubes are presented.Conclusion. Modern X-ray tubes are high-tech products that allow for high-resolution research of various objects. The main advantage of testing performed with the use of X-ray tubes consists in high resolution (micron and submicron). The X-ray images of test objects used to determine their spatial resolution are given, which clearly illustrate the vast possibilities of this technology. In addition, ways to improve microfocus X-ray tubes are briefly discussed. The considered materials can be useful in selecting a nondestructive testing tool, as well as in developing and creating X-ray systems on the basis of microfocus X-ray tubes.

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