scholarly journals Measurement of thin liquid film drainage using a novel high-speed impedance analyzer

1998 ◽  
Vol 69 (9) ◽  
pp. 3232-3239 ◽  
Author(s):  
Kevin O. Hool ◽  
Robert C. Saunders ◽  
Harry J. Ploehn
2006 ◽  
Author(s):  
H. Lan ◽  
M. Friedrich ◽  
B. F. Armaly ◽  
J. A. Drallmeier

Measurements and predictions of three-dimensional shear driven thin liquid films by turbulent air flow in a duct are reported. FLUENT - CFD code is used to perform the numerical simulations and the Reynolds Averaged Navier-Stokes and continuity equations along with the Volume of Fluid (VOF) model and the realizable k-ε turbulence model are implemented for this task. Film thickness and width are reported as a function of air flow rate, liquid film volume flow rate and surface tension, and a comparison with preliminary measured results is made. The thickness of the shear driven liquid film is measured using an interferometric technique that makes use of the phase shift between the reflection of incident light from the top and bottom surfaces of the thin liquid film. The spatial resolution is determined based on the spot size of the incident light, which for the current configuration of the transmitting optics is approximately 10 microns. The resulting fringe pattern is imaged using a high-speed imaging camera operating at 2000 frames per second. The technique has proved successful in measuring thickness between 100 and 900 microns in these shear driven films. Simulation results reveal that higher gas flow velocity decreases the film thickness but increases its width, while higher liquid film flow rate increases the film thickness and increases its width. Reasonable comparison appears to exist between preliminary measured and simulated results.


1989 ◽  
Vol 3 (4) ◽  
pp. 389-404
Author(s):  
Tohru FUKANO ◽  
Katsuhiko KADOGUCHI ◽  
Mikio KANAMORI ◽  
Akira TOMINAGA

Author(s):  
Ichiro Ueno ◽  
Kanji Hirose ◽  
Yusuke Kizaki ◽  
Yoshiaki Kisara ◽  
Yoshizumi Fukuhara

The authors pay their special attention to formation process of wafer-thin liquid film, known as ‘precursor film,’ ahead moving macroscopic contact line of a droplet spreading on a solid substrate. The spreading droplet on the solid substrate is accompanied with the movement of a visible boundary line so-called ‘macroscopic contact line.’ Existing studies have indicated there exits a thin liquid film known as ‘precursor film’ ahead the macroscopic contact line of the droplet. The present author’s group has dedicated their special effort to detect the formation process of the precursor film by applying a convectional laser interferometry and a high-speed camera, and to evaluate the spreading rate of the precursor film. In the present study, existing length of the precursor film at a very early stage of the droplet spreading is evaluated by applying a Brewster-angle microscopy as well as the interferometer. The authors extend their attention to the advancing process of the precursor film on inclined substrate.


2010 ◽  
Vol 343 (2) ◽  
pp. 584-593 ◽  
Author(s):  
Stoyan I. Karakashev ◽  
Dilyana S. Ivanova

2017 ◽  
Vol 121 (10) ◽  
pp. 5573-5584 ◽  
Author(s):  
Xurui Zhang ◽  
Rogerio Manica ◽  
Plamen Tchoukov ◽  
Qingxia Liu ◽  
Zhenghe Xu

2012 ◽  
Vol 134 (5) ◽  
Author(s):  
Ichiro Ueno ◽  
Kanji Hirose ◽  
Yusuke Kizaki ◽  
Yoshiaki Kisara ◽  
Yoshizumi Fukuhara

The authors pay their special attention to formation process of wafer-thin liquid film, known as “precursor film,” ahead moving macroscopic contact line of a droplet spreading on a solid substrate. The spreading droplet on the solid substrate is accompanied with the movement of a visible boundary line so-called “macroscopic contact line.” Existing studies have indicated there exits a thin liquid film known as precursor film ahead the macroscopic contact line of the droplet. The present author’s group has dedicated their special effort to detect the formation process of the precursor film by applying a convectional laser interferometry and a high-speed camera, and to evaluate the spreading rate of the precursor film. In the present study, existing length of the precursor film at a very early stage of the droplet spreading is evaluated by applying a Brewster-angle microscopy as well as the interferometer. The authors extend their attention to the advancing process of the precursor film on inclined substrate.


1998 ◽  
Vol 65 (1) ◽  
pp. 19-22 ◽  
Author(s):  
P.V.P. Yupapin ◽  
R. Chitaree ◽  
A.W. Palmer ◽  
K.T.V. Grattan ◽  
K. Weir

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