A low-cost and flexible double-crystal monochromator for an x-ray beamline

1998 ◽  
Vol 69 (3) ◽  
pp. 1230-1235 ◽  
Author(s):  
C. S. Hwang ◽  
F. Y. Lin ◽  
Chih-Hao Lee ◽  
Kuan-Li Yu ◽  
C. H. Hsieh ◽  
...  
Keyword(s):  
Low Cost ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator

A DOUBLE CRYSTAL MONOCHROMATOR FOR SOFT X-RAY BEAM LINE OF UVSOR

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-135-C8-137
Author(s):  
T. MURATA ◽  
T. MATSUKAWA ◽  
M. MORI ◽  
M. OBASHI ◽  
S.-I. NAO-E ◽  
...  
Keyword(s):  
Beam Line ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator

An accurate theory of X-ray coplanar multiple SRMS diffractometry

2018 ◽  
Vol 74 (6) ◽  
pp. 673-680 ◽  
Author(s):  
V. G. Kohn
Keyword(s):  
Synchrotron Radiation ◽  
Plane Wave ◽  
Experimental Setup ◽  
Incident Plane Wave ◽  
Instrumental Function ◽  
Multiple Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Incident Plane

The article reports an accurate theory of X-ray coplanar multiple diffraction for an experimental setup that consists of a generic synchrotron radiation (SR) source, double-crystal monochromator (M) and slit (S). It is called for brevity the theory of X-ray coplanar multiple SRMS diffractometry. The theory takes into account the properties of synchrotron radiation as well as the features of diffraction of radiation in the monochromator crystals and the slit. It is shown that the angular and energy dependence (AED) of the sample reflectivity registered by a detector has the form of a convolution of the AED in the case of the monochromatic plane wave with the instrumental function which describes the angular and energy spectrum of radiation incident on the sample crystal. It is shown that such a scheme allows one to measure the rocking curves close to the case of the monochromatic incident plane wave, but only using the high-order reflections by monochromator crystals. The case of four-beam (220)(331)({\overline {11}}1) diffraction in Si is considered in detail.

A double crystal monochromator with self-compensation mechanism for ELETTRA XRD2 beamline

2010 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
A. Gambitta
Keyword(s):  
Vertical Displacement ◽  
Compensation Mechanism ◽  
Input Beam ◽  
Output Beam ◽  
Double Crystal ◽  
X Ray ◽  
New Device ◽  
Double Crystal Monochromator ◽  
Fixed Distance

A prototype of a new double crystal monochromator (DCM) has been designed and developed for the second crystallography beamline (XRD2) at ELETTRA. The new device has to cover the 8–35 keV X-ray range. Since the corresponding diffraction angles are quite small, the choice has been to design a DCM with a fixed distance between the two crystals. As a consequence, the output beam has a small vertical displacement during the scan. This movement is compensated by means of an upstream mask, vertically moving and cutting the input beam at different heights. The movement of the mask is driven by a mechanism linked to the primary rotation of crystals (self-compensation), without any additional motor and following the displacement law required for compensation. The principle, the mechanism and the general mechanical concept of the device will be described in this paper.

HAXPES beamline PES-BL14 at the Indus-2 synchrotron radiation source

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Solid Samples ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Ccd Detector ◽  
Scientific Results

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.

A method to stabilize the incident X-ray energy for anomalous diffraction measurements

2017 ◽  
Vol 24 (4) ◽  
pp. 781-786
Author(s):  
Wenjia Wang ◽  
Xiaoyun Yang ◽  
Guangcai Chang ◽  
Pengfei An ◽  
Kewen Cha ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Data Collection ◽  
Absorption Edge ◽  
Feedback Loop ◽  
Inflection Point ◽  
Single Crystal Diffraction ◽  
Double Crystal ◽  
Anomalous Diffraction ◽  
X Ray ◽  
Double Crystal Monochromator

A method to calibrate and stabilize the incident X-ray energy for anomalous diffraction data collection is provided and has been successfully used at the single-crystal diffraction beamline 1W2B at the Beijing Synchrotron Radiation Facilities. Employing a feedback loop to control the movement of the double-crystal monochromator, this new method enables the incident X-ray energy to be kept within a 0.2 eV range at the inflection point of the absorption edge.

Position of exit X-rays from rotated-inclined double-crystal monochromators

1998 ◽  
Vol 5 (3) ◽  
pp. 679-681 ◽  
Author(s):  
Yasuharu Kashihara ◽  
Hiroshi Yamazaki ◽  
Kenji Tamasaku ◽  
Tetsuya Ishikawa
Keyword(s):  
Heat Load ◽  
Diffraction Theory ◽  
Third Generation ◽  
X Rays ◽  
Double Crystal ◽  
Undulator Radiation ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Asymmetric Reflection ◽  
Wide Range

The rotated-inclined double-crystal monochromator (RIDCM) has been adopted to reduce the heat load from third-generation undulator radiation. The position of the exit X-rays from RIDCM has been calculated as a function of X-ray energy on the basis of diffraction theory including refraction effects. The results show that the positions of the exit X-rays vary over a wide range due to asymmetric reflection. Methods of fixing the exit position in RIDCM are also discussed.

Time-resolved XAFS measurement using quick-scanning techniques at BSRF

2017 ◽  
Vol 24 (3) ◽  
pp. 674-678 ◽  
Author(s):  
Shengqi Chu ◽  
Lirong Zheng ◽  
Pengfei An ◽  
Hui Gong ◽  
Tiandou Hu ◽  
...  
Keyword(s):  
Signal To Noise Ratio ◽  
High Energy ◽  
High Energy Resolution ◽  
Double Crystal ◽  
Time Resolved ◽  
Edge Structure ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Good Signal ◽  
X Ray Absorption

A new quick-scanning X-ray absorption fine-structure (QXAFS) system has been established on beamline 1W1B at the Beijing Synchrotron Radiation Facility. As an independent device, the QXAFS system can be employed by other beamlines equipped with a double-crystal monochromator to carry out quick energy scans and data acquisition. Both continuous-scan and trapezoidal-scan modes are available in this system to satisfy the time scale from subsecond (in the X-ray absorption near-edge structure region) to 1 min. Here, the trapezoidal-scan method is presented as being complementary to the continuous-scan method, in order to maintain high energy resolution and good signal-to-noise ratio. The system is demonstrated to be very reliable and has been combined with in situ cells to carry out time-resolved XAFS studies.

Performance of the Daresbury synchrotron radiation source soft x‐ray double‐crystal monochromator

1992 ◽  
Vol 63 (1) ◽  
pp. 1322-1325 ◽  
Author(s):  
M. D. Roper ◽  
P. A. Buksh ◽  
I. W. Kirkman ◽  
G. van der Laan ◽  
H. A. Padmore ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Radiation Source ◽  
Synchrotron Radiation Source ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator
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