Fiber interferometer-based variable temperature scanning force microscope

1997 ◽  
Vol 68 (4) ◽  
pp. 1776-1778 ◽  
Author(s):  
R. Euler ◽  
U. Memmert ◽  
U. Hartmann
Keyword(s):  
Variable Temperature ◽  
Scanning Force Microscope ◽  
Scanning Force ◽  
Temperature Scanning

scholarly journals Design of a variable temperature scanning force microscope

2009 ◽  
Vol 80 (8) ◽  
pp. 083704 ◽  
Author(s):  
E. Nazaretski ◽  
K. S. Graham ◽  
J. D. Thompson ◽  
J. A. Wright ◽  
D. V. Pelekhov ◽  
...  
Keyword(s):  
Variable Temperature ◽  
Scanning Force Microscope ◽  
Scanning Force ◽  
Temperature Scanning

Hall Potential Profiles in Quantum Hall Samples Measured by a Low-Temperature Scanning Force Microscope

2007 ◽  
Vol 21 (08n09) ◽  
pp. 1297-1306 ◽  
Author(s):  
JÜRGEN WEIS
Keyword(s):  
Quantum Hall ◽  
Electron System ◽  
Scanning Force Microscope ◽  
Ohmic Behavior ◽  
Dimensional Electron System ◽  
Scanning Force ◽  
Temperature Scanning ◽  
Interface Line ◽  
Partial Depletion

Our measurements of the Hall potential distribution in GaAs/AlGaAs quantum Hall samples using a scanning force microscope at a temperature of 1.4 K are reviewed. The results emphasize the important role of compressible and incompressible strips, running along the edges of the two-dimensional electron system (2DES), for the quantum Hall effect. At the interface line between the 2DES and its alloyed metal contact with good ohmic behavior, a partial depletion of the electron concentration in the 2DES in front of contact is identified, causing for certain magnetic field regimes an incompressible strip lying in parallel to the interface line and therefore isolating the compressible 2DES bulk from the 2DES edge with the contact.

Surface characterization of P3OT thin films by variable temperature scanning force microscopy

2011 ◽  
Vol 161 (15-16) ◽  
pp. 1651-1659 ◽  
Author(s):  
E. López-Elvira ◽  
B. García-Pérez ◽  
J. Colchero ◽  
E. Palacios-Lidón
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Variable Temperature ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Temperature Scanning

Compact scanning-force microscope using a laser diode

1988 ◽  
Vol 13 (12) ◽  
pp. 1057 ◽  
Author(s):  
Dror Sarid ◽  
L. Stephen Bell ◽  
Doug Iams ◽  
Volker Weissenberger
Keyword(s):  
Laser Diode ◽  
Scanning Force Microscope ◽  
Scanning Force
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