New photothermal deflection method for thermal diffusivity measurement of semiconductor wafers

1997 ◽  
Vol 68 (3) ◽  
pp. 1521-1526 ◽  
Author(s):  
M. Bertolotti ◽  
V. Dorogan ◽  
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...  
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Chang-yong Li ◽  
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Suotang Jia ◽  
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2021 ◽  
Vol 42 (10) ◽  
Author(s):  
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Paulo César Sales da Silva ◽  
Luiz Roberto Rocha de Lucena ◽  
Rômulo Pierre Batista dos Reis ◽  
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ChemInform ◽  
2001 ◽  
Vol 32 (15) ◽  
pp. no-no
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Vol 89 (10) ◽  
pp. 104905
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