In situ grazing incidence x‐ray diffraction system for clusters deposited on a low‐temperature substrate

1996 ◽  
Vol 67 (12) ◽  
pp. 4092-4097 ◽  
Author(s):  
Kenji Koga ◽  
Harutoshi Takeo
Keyword(s):  
Low Temperature ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Structure of in-situ grown GaAs(001) reconstructed surfaces by grazing incidence X-ray diffraction

1989 ◽  
Vol 211-212 ◽  
pp. 39-47 ◽  
Author(s):  
M. Sauvage-Simkin ◽  
R. Pinchaux ◽  
J. Massies ◽  
P. Claverie ◽  
J. Bonnet ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surfaces

Ultrahigh‐vacuum four‐circle diffractometer for grazing incidence x‐ray diffraction on in situ MBE grown III‐V semiconductor surfaces

1989 ◽  
Vol 60 (7) ◽  
pp. 2369-2372 ◽  
Author(s):  
P. Claverie ◽  
J. Massies ◽  
R. Pinchaux ◽  
M. Sauvage‐Simkin ◽  
J. Frouin ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Semiconductor Surfaces ◽  
X Ray Diffraction ◽  
X Ray

Inorganic mixed phase templated by a fatty acid monolayer at the air–water interface: the Mn and Mg case

2018 ◽  
Vol 20 (9) ◽  
pp. 6629-6637 ◽  
Author(s):  
Alae El Haitami ◽  
Michel Goldmann ◽  
Philippe Fontaine ◽  
Marie-Claude Fauré ◽  
Sophie Cantin
Keyword(s):  
Grazing Incidence ◽  
Water Interface ◽  
X Ray Diffraction ◽  
Inorganic Layer ◽  
X Ray ◽  
First Order ◽  
First Order Phase Transition ◽  
Air Water Interface ◽  
First Order Phase

A first-order phase transition with a peculiar feature is evidenced by means of in situ grazing incidence X-ray diffraction in the 2D organic phase-mediated nucleation of an inorganic layer.

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Dimethyl-, Disilyl- and Digermylsulfide: Different Intermolecular Contacts in the Solid State

2004 ◽  
Vol 59 (6) ◽  
pp. 635-638 ◽  
Author(s):  
Norbert W. Mitzel ◽  
Udo Losehand
Keyword(s):  
Solid State ◽  
Low Temperature ◽  
Crystal Structures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Intermolecular Contacts

The compounds (H3C)2S, (H3Si)2S and (H3Ge)2S have been crystallised in situ on a diffractometer and their crystal structures determined by low-temperature X-ray diffraction. The molecules are present as monomers in the crystals. The aggregation of the molecules through secondary intermolecular contacts in the crystal is different: (H3C)2S is weakly associated into dimers by S···S contacts, whereas (H3Si)2S and (H3Ge)2S form Si···S and Ge···S contacts in an ice-analogous aggregation motif. Important geometry parameters are (H3C)2S: C-S 1.794(av) Å , C-S-C 99.2(1)°; (H3Si)2S: Si- S 2.143(1) Å , Si-S-Si 98.4°; (H3Ge)2S Ge-S 2.223(2) and 2.230(2) Å , Ge-S-Ge 98.2(1)◦.

scholarly journals Electrochemical Surface Oxidation of Copper Studied by in Situ Grazing Incidence X-ray Diffraction

2019 ◽  
Vol 123 (21) ◽  
pp. 13253-13262 ◽  
Author(s):  
Michael Scherzer ◽  
Frank Girgsdies ◽  
Eugen Stotz ◽  
Marc-Georg Willinger ◽  
Elias Frei ◽  
...  
Keyword(s):  
Surface Oxidation ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray
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