Determination of concentration depth profiles using total‐reflection x‐ray fluorescence spectrometry in combination with ion‐beam etching

1996 ◽  
Vol 67 (6) ◽  
pp. 2332-2336 ◽  
Author(s):  
R. Günther ◽  
G. Wiener ◽  
J. Knoth ◽  
H. Schwenke ◽  
R. Bormann
2007 ◽  
Vol 62 (1) ◽  
pp. 82-85 ◽  
Author(s):  
Sangita Dhara ◽  
Nand Lal Misra ◽  
Khush Dev Singh Mudher ◽  
Suresh Kumar Aggarwal

2020 ◽  
Vol 412 (24) ◽  
pp. 6419-6429
Author(s):  
Andreas Gruber ◽  
Riccarda Müller ◽  
Alessa Wagner ◽  
Silvia Colucci ◽  
Maja Vujić Spasić ◽  
...  

1997 ◽  
Vol 52 (7) ◽  
pp. 1033-1038 ◽  
Author(s):  
A. Wittershagen ◽  
P. Rostam-Khani ◽  
O. Klimmek ◽  
R. Groß ◽  
V. Zickermann ◽  
...  

2018 ◽  
Vol 33 (5) ◽  
pp. 876-882 ◽  
Author(s):  
Kaushik Sanyal ◽  
N. L. Misra

Trace levels of F in high-purity water samples were determined using vacuum chamber total reflection X-ray fluorescence spectrometry.


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