XSCAN x‐ray data acquisition and analysis software for the MATRIX X‐18A x‐ray scattering beamline at the NSLS

1996 ◽  
Vol 67 (9) ◽  
pp. 3369-3370 ◽  
Author(s):  
S. N. Ehrlich ◽  
J. A. Schwanof ◽  
X. Yang ◽  
G. L. Liedl
Keyword(s):  
Data Acquisition ◽  
Analysis Software ◽  
X Ray ◽  
X Ray Scattering ◽  
The Matrix ◽  
Ray Scattering

Employing X-ray scattering to characterize materials with grain sizes in the nano-regime

2008 ◽  
Vol 23 (2) ◽  
pp. 96-100 ◽  
Author(s):  
E. A. Laitila ◽  
D. E. Mikkola
Keyword(s):  
Crystallite Size ◽  
Large Fraction ◽  
Matrix Material ◽  
Background Intensity ◽  
X Ray ◽  
Volume Fractions ◽  
X Ray Scattering ◽  
The Matrix ◽  
Diffraction Peaks ◽  
Ray Scattering

This study focuses on characterization of an (Al,Cr)3Ti alloy processed together with titanium powder by reactive mechanical milling (RMM) to produce an ultrafine grained intermetallic alloy matrix with in situ carbide and hydride phases formed during processing. Observations of X-ray scattering as RMM processing time increases show severe broadening of matrix diffraction peaks, accompanied by the appearance of diffraction peaks resulting from the formation of very small crystallites of TiC and TiH1.92 phases with increasing volume fractions, and finally, increasing background intensity as the crystallite size of the matrix phase decreases to ∼2 nm. Estimates of phase volume fractions were made by the direct comparison method, along with crystallite sizes by Warren–Averbach peak profile analysis. The general increase in background intensities has been attributed to random static displacements of the large fraction of atoms located within the grain boundary regions. Further, it has been concluded that the matrix material with a crystallite size of a few nanometers has about half the atoms in statically displaced positions defining the boundary regions. The results argue that background intensity changes should not be ignored and are useful in interpreting scattering from these nano-scale materials.

scholarly journals Improved data acquisition in grazing-incidence X-ray scattering experiments using a pixel detector

2005 ◽  
Vol 61 (4) ◽  
pp. 418-425 ◽  
Author(s):  
C. M. Schlepütz ◽  
R. Herger ◽  
P. R. Willmott ◽  
B. D. Patterson ◽  
O. Bunk ◽  
...  
Keyword(s):  
Data Acquisition ◽  
Grazing Incidence ◽  
Pixel Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Integrated beamline control and data acquisition for small-angle X-ray scattering at the P12 BioSAXS beamline at PETRAIII storage ring DESY

2018 ◽  
Vol 25 (3) ◽  
pp. 906-914 ◽  
Author(s):  
Nelly R. Hajizadeh ◽  
Daniel Franke ◽  
Dmitri I. Svergun
Keyword(s):  
Data Acquisition ◽  
Small Angle ◽  
Size Exclusion ◽  
Full Potential ◽  
X Ray ◽  
X Ray Scattering ◽  
Exclusion Chromatography ◽  
Novice Users ◽  
Intuitive Interface ◽  
Ray Scattering

The versatility of small-angle X-ray scattering (SAXS) as a structural biology method is apparent by its compatibility with many experimental set-ups. Most advanced SAXS studies are conducted at dedicated synchrotron beamlines yielding high beam brilliance, throughput and temporal resolution. However, utilizing the full potential of the method while preserving a high degree of automation provides a challenge to any SAXS beamline. This challenge is especially pertinent at the P12 BioSAXS beamline of the EMBL at the PETRAIII Synchrotron DESY (Hamburg, Germany), optimized and dedicated to scattering of macromolecular solutions. Over 200 unique set-ups are possible at this beamline offering various functionalities, including different temporal and spatial resolutions. Presented here is a beamline control and data-acquisition software,BECQUEREL, designed to maximize flexibility and automation in the operation of P12. In the frame of a single intuitive interface the control system allows for convenient operation with all hardware set-ups available at P12 including a robotic sample changer, in-line size-exclusion chromatography, stop-flow devices, microfluidic spinning disk and various in-air settings. Additional functionalities are available to assist the data-collection procedure for novice users, and also routine operation of the support staff.

Influence of stress on the properties of Ge nanocrystals in an SiO2matrix

2016 ◽  
Vol 49 (6) ◽  
pp. 1957-1966 ◽  
Author(s):  
Branko Pivac ◽  
Pavo Dubček ◽  
Jasminka Popović ◽  
Jasna Dasović ◽  
Sigrid Bernstorff ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Rf Magnetron Sputtering ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Visible Part ◽  
Strong Luminescence ◽  
The Matrix ◽  
Ray Scattering

In this work, self-assembled Ge quantum dot (QD) formation in a dielectric matrix is explored. Of particular interest were their structural and optical properties, in order to understand the stress build-up in such a process and its impact on the material properties during processing. To this end, thin films consisting of (Ge + SiO2)/SiO2multilayers grown by RF magnetron sputtering were deposited at room temperature. Annealing of such films at 873 K in inert N2atmosphere produced, at the position of the Ge-rich SiO2layers, a high lateral density (about 1012 cm−2) of Ge QDs with a good crystallinity. SiO2spacer layers separated the adjacent Ge-rich layers, where the Ge QDs were formed with a diameter of about the size of the (Ge + SiO2) as-deposited layer thickness, and created a good vertical repeatability, confirmed by the appearance of a Bragg sheet in two-dimensional small-angle X-ray scattering patterns. The structural analysis, by wide-angle X-ray diffraction, grazing-incidence small-angle X-ray scattering and transmission electron microscopy, has shown that the described processing of the films induced large compressive stress on the formed QDs. Optical analysis by time-resolved photoluminescence (PL) revealed that the high density of crystalline Ge QDs embedded in the amorphous SiO2matrix produced a strong luminescence in the visible part of the spectrum at 2–2.5 eV photon energy. It is shown that the decay dynamics in this energy range are very fast, and therefore the transitions that create such PL are attributed to matrix defects present in the shell surrounding the Ge QD surface (interface region with the matrix). The measured PL peak, though wide at its half-width, when analysed in consecutive short spectral segments showed the same decay dynamics, suggesting the same mechanism of relaxation.

Microtubule nucleation sequence studied by time-resolved x-ray scattering and electron microscopy

1983 ◽  
Vol 41 ◽  
pp. 766-767
Author(s):  
Eva-Maria Mandelkow ◽  
Eckhard Mandelkow ◽  
Joan Bordas
Keyword(s):  
Electron Microscopy ◽  
Dynamic Equilibrium ◽  
Time Resolved ◽  
X Ray ◽  
Additional Information ◽  
X Ray Scattering ◽  
Low Concentrations ◽  
Microtubule Growth ◽  
Ray Patterns ◽  
Ray Scattering

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.

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