Polarization characterization of circularly polarized vacuum‐ultraviolet and soft‐x‐ray helical undulator radiation

1995 ◽  
Vol 66 (2) ◽  
pp. 1923-1925 ◽  
Author(s):  
T. Koide ◽  
T. Shidara ◽  
T. Miyahara ◽  
M. Yuri
Keyword(s):  
Vacuum Ultraviolet ◽  
Undulator Radiation ◽  
Circularly Polarized ◽  
X Ray

Magnetic domain‐specific microspectroscopy with a scanning x‐ray microscope using circularly polarized undulator radiation

1996 ◽  
Vol 80 (5) ◽  
pp. 3124-3126 ◽  
Author(s):  
Y. Kagoshima ◽  
T. Miyahara ◽  
M. Ando ◽  
J. Wang ◽  
S. Aoki
Keyword(s):  
Magnetic Domain ◽  
Undulator Radiation ◽  
Circularly Polarized ◽  
X Ray ◽  
Domain Specific

Characterization of a microfocused circularly polarized x-ray probe

2000 ◽  
Vol 71 (6) ◽  
pp. 2386-2390 ◽  
Author(s):  
J. Pollmann ◽  
G. Srajer ◽  
J. Maser ◽  
J. C. Lang ◽  
C. S. Nelson ◽  
...  
Keyword(s):  
Circularly Polarized ◽  
X Ray

Preparation and characterization of pixelated phosphor screens for high-resolution linear imaging in the vacuum ultraviolet and x-ray ranges

2004 ◽  
Vol 75 (10) ◽  
pp. 3998-4000 ◽  
Author(s):  
L. Rodríguez-Barquero ◽  
B. Zurro ◽  
P. Martin ◽  
K. J. McCarthy ◽  
A. Baciero
Keyword(s):  
High Resolution ◽  
Vacuum Ultraviolet ◽  
X Ray ◽  
Phosphor Screens

Spectral characterization of undulator radiation in the soft x-ray region

1986 ◽  
Vol 25 (18) ◽  
pp. 3260 ◽  
Author(s):  
Hideki Maezawa ◽  
Yoshio Suzuki ◽  
Hideo Kitamura ◽  
Taizo Sasaki
Keyword(s):  
Spectral Characterization ◽  
Undulator Radiation ◽  
X Ray

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

Sign in / Sign up

Export Citation Format

Share Document