Correlation of critical current and resistance fluctuations in bicrystal grain boundary Josephson junctions

1995 ◽  
Vol 67 (13) ◽  
pp. 1929-1931 ◽  
Author(s):  
A. Marx ◽  
U. Fath ◽  
L. Alff ◽  
R. Gross
Keyword(s):  
Grain Boundary ◽  
Critical Current ◽  
Josephson Junctions ◽  
Resistance Fluctuations

Analysis of the critical current density in grain boundary Josephson junctions on a nanometer scale

1995 ◽  
Vol 66 (17) ◽  
pp. 2289-2291 ◽  
Author(s):  
O. M. Froehlich ◽  
H. Schulze ◽  
A. Beck ◽  
B. Mayer ◽  
L. Alff ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Josephson Junctions ◽  
Nanometer Scale

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations

2012 ◽  
Vol 101 (9) ◽  
pp. 092601 ◽  
Author(s):  
S. M. Anton ◽  
C. D. Nugroho ◽  
J. S. Birenbaum ◽  
S. R. O’Kelley ◽  
V. Orlyanchik ◽  
...  
Keyword(s):  
Critical Current ◽  
Josephson Junctions ◽  
Low Frequency ◽  
Temperature Fluctuations ◽  
Current Noise
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