Efficiency and stray light measurements and calculations of diffraction gratings for the Advanced Light Source

1995 ◽  
Vol 66 (2) ◽  
pp. 2160-2163 ◽  
Author(s):  
Wayne R. McKinney ◽  
Dmitri Mossessian ◽  
Eric Gullikson ◽  
Philip Heimann
Keyword(s):  
Light Source ◽  
Diffraction Gratings ◽  
Stray Light ◽  
Advanced Light Source

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source

Advanced Light Source Operation and Critical Research during the COVID-19 Pandemic

2021 ◽  
Vol 34 (1-3) ◽  
pp. 27-29
Author(s):  
A. Scholl, ◽  
D. Parkinson ◽  
R. Koch, ◽  
L. Tamura
Keyword(s):  
Light Source ◽  
Critical Research ◽  
Advanced Light Source ◽  
Source Operation

Advanced Light Source Update

2012 ◽  
Vol 25 (3) ◽  
pp. 25-30 ◽  
Author(s):  
L. Tamura ◽  
Z. Hussain ◽  
H. A. Padmore ◽  
D. S. Robin ◽  
S. Bailey ◽  
...  
Keyword(s):  
Light Source ◽  
Advanced Light Source

Performance of the vacuum ultraviolet high-resolution and high-flux beamline for chemical dynamics studies at the Advanced Light Source

1997 ◽  
Vol 68 (5) ◽  
pp. 1945-1951 ◽  
Author(s):  
P. A. Heimann ◽  
M. Koike ◽  
C. W. Hsu ◽  
D. Blank ◽  
X. M. Yang ◽  
...  
Keyword(s):  
High Resolution ◽  
Light Source ◽  
Vacuum Ultraviolet ◽  
High Flux ◽  
Chemical Dynamics ◽  
Advanced Light Source

scholarly journals X-Ray Diffraction under Extreme Conditions at the Advanced Light Source

2018 ◽  
Vol 2 (1) ◽  
pp. 4 ◽  
Author(s):  
Camelia Stan ◽  
Christine Beavers ◽  
Martin Kunz ◽  
Nobumichi Tamura
Keyword(s):  
Light Source ◽  
Extreme Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Advanced Light Source

Recent developments in EUV reflectometry at the Advanced Light Source

2001 ◽  
Author(s):  
Eric M. Gullikson ◽  
Stanley Mrowka ◽  
Benjamin B. Kaufmann
Keyword(s):  
Light Source ◽  
Advanced Light Source ◽  
Recent Developments

scholarly journals Synchrotron X-Ray Microdiffraction Studies of Electromigration in Interconnect lines at the Advanced Light Source

2009 ◽  
Author(s):  
N. Tamura ◽  
K. Chen ◽  
M. Kunz ◽  
Paul S. Ho ◽  
Ehrenfried Zschech ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray ◽  
Advanced Light Source ◽  
Interconnect Lines
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