More information on the calibration of scanning stylus microscopes by two‐dimensional fast Fourier‐transform analysis
1994 ◽
Vol 65
(9)
◽
pp. 2860-2863
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1989 ◽
Vol 52
(3)
◽
pp. 333-336
◽
Keyword(s):
1991 ◽
Vol 33
(2)
◽
pp. 101-110
◽
Keyword(s):
Keyword(s):