New time‐of‐flight electronics for atom‐probe field‐ion microscopy

D. K. Chan; B. M. Davis; D. N. Seidman

doi:10.1063/1.1144798

New time‐of‐flight electronics for atom‐probe field‐ion microscopy

Review of Scientific Instruments ◽

10.1063/1.1144798 ◽

1994 ◽

Vol 65 (6) ◽

pp. 1973-1977 ◽

Cited By ~ 5

Author(s):

D. K. Chan ◽

B. M. Davis ◽

D. N. Seidman

Keyword(s):

Time Of Flight ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

New Time

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The Atomic Structure and Atomic Layer Compositional Analysis of Thin Solid Films Using the Time-of-Flight Atom-Probe Field Ion Microscopy

Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341827-2.50016-9 ◽

1988 ◽

pp. 449-478

Author(s):

T.T. TSONG

Keyword(s):

Atomic Structure ◽

Time Of Flight ◽

Compositional Analysis ◽

Atomic Layer ◽

Atom Probe ◽

Probe Field ◽

Thin Solid Films ◽

Field Ion Microscopy ◽

Solid Films ◽

Ion Microscopy

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Cited By ~ 2

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Atom Probe ◽

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

Ion Microscopy

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Cited By ~ 9

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Atom Probe ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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Chemical Homogeneity of NiPdP Metallic Glasses Studied by Atom Probe-Field Ion Microscopy / Feldionenmikroskop- und Atomsonden-Untersuchungen zur chemischen Homogenität metallener NiPdP-Gläser

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1989-800101 ◽

1989 ◽

Vol 80 (1) ◽

pp. 1-8

Author(s):

Michael Oehring

Keyword(s):

Metallic Glasses ◽

Atom Probe ◽

Probe Field ◽

Chemical Homogeneity ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom-probe field ion microscopy

Microchimica Acta ◽

10.1007/bf01244464 ◽

1992 ◽

Vol 107 (3-6) ◽

pp. 95-104 ◽

Cited By ~ 2

Author(s):

Manfred Leisch

Keyword(s):

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy

Journal of Physics E Scientific Instruments ◽

10.1088/0022-3735/16/7/014 ◽

1983 ◽

Vol 16 (7) ◽

pp. 617-619 ◽

Cited By ~ 45

Author(s):

A Henjered ◽

H Norden

Keyword(s):

Atom Probe ◽

Specimen Preparation ◽

Preparation Technique ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom Probe-Field Ion Microscopy and Mössbauer Spectroscopy of Low Temperature Phase Decomposition in a Ferritic Stainless Steel

Materials Transactions JIM ◽

10.2320/matertrans1989.36.16 ◽

1995 ◽

Vol 36 (1) ◽

pp. 16-22 ◽

Cited By ~ 3

Author(s):

Yuichi Ishikawa ◽

Toshihiko Yoshimura ◽

Atsushi Moriai ◽

Hisashi Kuwano

Keyword(s):

Stainless Steel ◽

Low Temperature ◽

Ferritic Stainless Steel ◽

Atom Probe ◽

Temperature Phase ◽

Phase Decomposition ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Low Temperature Phase

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Direct measurement of carbon solubility in the intermetallic (Fe,Cr)2(Mo,W) Laves phase using atom-probe field-ion microscopy

Scripta Materialia ◽

10.1016/1359-6462(95)00569-2 ◽

1996 ◽

Vol 34 (5) ◽

pp. 741-747 ◽

Cited By ~ 23

Author(s):

L.M. Lundin

Keyword(s):

Direct Measurement ◽

Atom Probe ◽

Laves Phase ◽

Carbon Solubility ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom Probe Field-Ion Microscopy Characterization of Nickel and Titanium Aluminides

Materials Characterization ◽

10.1016/s1044-5803(99)00049-2 ◽

2000 ◽

Vol 44 (1-2) ◽

pp. 159-176 ◽

Cited By ~ 15

Author(s):

D.J Larson ◽

M.K Miller

Keyword(s):

Titanium Aluminides ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Microscopy Characterization

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