Charge‐coupled‐device based time‐of‐flight charged particle analyzer

1993 ◽  
Vol 64 (11) ◽  
pp. 3132-3138 ◽  
Author(s):  
Thomas A. Germer ◽  
Rowena Y. Young ◽  
W. Ho ◽  
Mihir K. Ravel
Keyword(s):  
Charged Particle ◽  
Time Of Flight ◽  
Charge Coupled Device

Use of charge-coupled device imagers for charged-particle spectroscopy

1997 ◽  
Vol 68 (1) ◽  
pp. 599-602 ◽  
Author(s):  
B. E. Burke ◽  
R. D. Petrasso ◽  
C. K. Li ◽  
T. C. Hotaling
Keyword(s):  
Charged Particle ◽  
Charge Coupled Device

Design and fabrication of a time-of-flight spectrometer for studies of multiple ionization of gases by charged particle impact

Pramana ◽  
2002 ◽  
Vol 58 (4) ◽  
pp. 623-638 ◽  
Author(s):  
RK Singh ◽  
RK Mohanta ◽  
MJ Singh ◽  
R Hippler ◽  
SK Goel ◽  
...  
Keyword(s):  
Charged Particle ◽  
Time Of Flight ◽  
Particle Impact ◽  
Multiple Ionization

Charged particle mass identification by energy-time-of-flight technique

1973 ◽  
Vol 113 (1) ◽  
pp. 93-99 ◽  
Author(s):  
E. Andrade ◽  
D. Rendić ◽  
V.A. Otte ◽  
G.C. Phillips
Keyword(s):  
Charged Particle ◽  
Time Of Flight ◽  
Particle Mass ◽  
Mass Identification
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