Conversion of a double crystal diffractometer to a high resolution triple crystal diffractometer

1992 ◽  
Vol 63 (12) ◽  
pp. 5591-5596 ◽  
Author(s):  
R. J. Matyi
Keyword(s):  
High Resolution ◽  
Double Crystal ◽  
Double Crystal Diffractometer

High-efficiency transmission neutron polarizer for high-resolution double crystal diffractometer

1997 ◽  
Vol 234-236 ◽  
pp. 1071-1073 ◽  
Author(s):  
A. Ioffe ◽  
G. Gordeev ◽  
B. Ibrayev ◽  
Th. Krist ◽  
F. Mezei
Keyword(s):  
High Resolution ◽  
High Efficiency ◽  
Double Crystal ◽  
Double Crystal Diffractometer

A `beam-selection' high-resolution X-ray diffractometer

2004 ◽  
Vol 37 (4) ◽  
pp. 565-574 ◽  
Author(s):  
Paul F. Fewster
Keyword(s):  
High Resolution ◽  
High Intensity ◽  
Double Crystal ◽  
Low Background ◽  
X Ray ◽  
Minimal Sample ◽  
Beam Selection ◽  
Routine Basis ◽  
Sample Alignment ◽  
Double Crystal Diffractometer

A new diffractometer that can be described as a high-intensity low-background high-resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is less obvious. The sample requires minimal sample alignment, the resolution can be adjusted to optimize the experiment and the wavelength dispersion can be controlled. This diffractometer can produce near perfect profiles from bent and imperfect samples. The illuminated area can easily be varied from greater than 3 mm down to 50 µm diameter, offering great opportunities in microdiffraction with high resolution. The instrument appears similar to a double-crystal diffractometer in reverse,i.e.the sample and collimating crystal of a conventional double-crystal diffractometer are reversed; however, the concept is quite different.

The Use of a Multi-Double-Crystal Diffractometer to Investigate Nickel Domains

1997 ◽  
Vol 30 (5) ◽  
pp. 849-853 ◽  
Author(s):  
W. Treimer ◽  
A. Höfer ◽  
H. Strothmann
Keyword(s):  
Single Crystals ◽  
Domain Structure ◽  
Small Angle ◽  
Angular Resolution ◽  
Main Peak ◽  
High Angular Resolution ◽  
Bloch Wall ◽  
Double Crystal ◽  
First Results ◽  
Double Crystal Diffractometer

The investigations of the domain structure in Ni single crystals is best performed with a double-crystal diffractometer. Conventional small-angle instruments do not have the necessary angular resolution to distinguish satellites of a main peak due to spin-dependent refraction of unpolarized neutrons by Bloch walls in Ni. With the help of a double-crystal diffractometer operating with lamellae crystals as monochromator and analyzer, the angular resolution is maintained but the intensity enhanced by a factor of 5.4. Within a series of measurements, it was possible to investigate Ni domains due to the high angular resolution of the new multi-double-crystal instrument and this improved intensity. The first results of the domain structure in (110) Ni single crystals and a good estimation of the Bloch wall thickness are given.

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