Nonperturbing electron beam probe to diagnose charged‐particle beams

1992 ◽  
Vol 63 (5) ◽  
pp. 3027-3039 ◽  
Author(s):  
John A. Pasour ◽  
Mai T. Ngo
Keyword(s):  
Electron Beam ◽  
Charged Particle ◽  
Particle Beams ◽  
Charged Particle Beams

Characterization of 2D Al2O3:C,Mg radiophotoluminescence films in charged particle beams

2021 ◽  
Vol 141 ◽  
pp. 106518
Author(s):  
Marijke De Saint-Hubert ◽  
Fabio Castellano ◽  
Paul Leblans ◽  
Paul Sterckx ◽  
Satoshi Kodaira ◽  
...  
Keyword(s):  
Charged Particle ◽  
Particle Beams ◽  
Charged Particle Beams

scholarly journals Charged particle guiding and beam splitting with auto-ponderomotive potentials on a chip

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Robert Zimmermann ◽  
Michael Seidling ◽  
Peter Hommelhoff
Keyword(s):  
Charged Particle ◽  
Large Range ◽  
Proof Of Concept ◽  
Beam Splitting ◽  
Particle Beams ◽  
Effective Potentials ◽  
Charged Particle Beams ◽  
Electrons And Ions ◽  
Ponderomotive Forces ◽  
Planar Substrates

AbstractElectron and ion beams are indispensable tools in numerous fields of science and technology, ranging from radiation therapy to microscopy and lithography. Advanced beam control facilitates new functionalities. Here, we report the guiding and splitting of charged particle beams using ponderomotive forces created by the motion of charged particles through electrostatic optics printed on planar substrates. Shape and strength of the potential can be locally tailored by the lithographically produced electrodes’ layout and the applied voltages, enabling the control of charged particle beams within precisely engineered effective potentials. We demonstrate guiding of electrons and ions for a large range of energies (from 20 to 5000 eV) and masses (from 5 · 10−4 to 131 atomic mass units) as well as electron beam splitting for energies up to the keV regime as a proof-of-concept for more complex beam manipulation.

Theory and Design of Charged Particle Beams

Physics Today ◽  
1995 ◽  
Vol 48 (6) ◽  
pp. 59-59
Author(s):  
Martin Reiser ◽  
Edward P. Lee
Keyword(s):  
Charged Particle ◽  
Particle Beams ◽  
Charged Particle Beams
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