X‐ray crystal truncation rod scattering measurement of AsH3‐exposed InP/InPAs/InP single heterostructures

1995 ◽  
Vol 66 (3) ◽  
pp. 332-334 ◽  
Author(s):  
Yoshikazu Takeda ◽  
Yoshiyuki Sakuraba ◽  
Kei Fujibayashi ◽  
Masao Tabuchi ◽  
Takayuki Kumamoto ◽  
...  
Keyword(s):  
X Ray ◽  
Crystal Truncation Rod ◽  
Scattering Measurement

Crystal truncation rod X-ray scattering: exact dynamical calculation

2008 ◽  
Vol 41 (1) ◽  
pp. 18-26 ◽  
Author(s):  
Václav Holý ◽  
Paul F. Fewster
Keyword(s):  
Reciprocal Lattice ◽  
Dynamical Theory ◽  
Lattice Points ◽  
Space Distribution ◽  
Matrix Formalism ◽  
X Ray ◽  
Transmission Coefficients ◽  
X Ray Scattering ◽  
Crystal Truncation Rod ◽  
Scattering Geometry

A new method is presented for a calculation of the reciprocal-space distribution of X-ray diffracted intensity along a crystal truncation rod. In contrast to usual kinematical or dynamical approaches, the method is correct both in the reciprocal-lattice points and between them. In the method, the crystal is divided into a sequence of very thin slabs parallel to the surface; in contrast to the well known Darwin dynamical theory, the electron density in the slabs is constant along the surface normal. The diffracted intensity is calculated by a matrix formalism based on the Fresnel reflection and transmission coefficients. The method is applicable for any polarization of the primary beam and also in a non-coplanar scattering geometry.

Determination of composition distributions in InP/InGaAs/InP quantum-well structures by X-ray crystal truncation rod scattering and quantum levels

1998 ◽  
Vol 186 (1-2) ◽  
pp. 48-54 ◽  
Author(s):  
M Tabuchi ◽  
K Fujibayashi ◽  
N Yamada ◽  
K Hagiwara ◽  
A Kobashi ◽  
...  
Keyword(s):  
Quantum Well ◽  
Quantum Well Structures ◽  
X Ray ◽  
Crystal Truncation Rod

X-ray CTR scattering measurement of InP/InGaAs/InP interface structures fabricated by different growth processes

2000 ◽  
Vol 159-160 ◽  
pp. 250-255 ◽  
Author(s):  
M Tabuchi ◽  
R Takahashi ◽  
M Araki ◽  
K Hirayama ◽  
N Futakuchi ◽  
...  
Keyword(s):  
Growth Processes ◽  
X Ray ◽  
Interface Structures ◽  
Scattering Measurement
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