Boron‐induced morphology changes in silicon chemical vapor deposition: A scanning tunneling microscopy study

1995 ◽  
Vol 66 (16) ◽  
pp. 2057-2059 ◽  
Author(s):  
Yajun Wang ◽  
Robert J. Hamers
RSC Advances ◽  
2016 ◽  
Vol 6 (100) ◽  
pp. 98001-98009 ◽  
Author(s):  
Thais Chagas ◽  
Thiago H. R. Cunha ◽  
Matheus J. S. Matos ◽  
Diogo D. dos Reis ◽  
Karolline A. S. Araujo ◽  
...  

We have used atomically-resolved scanning tunneling microscopy and spectroscopy to study the interplay between the atomic and electronic structure of graphene formed on copper via chemical vapor deposition.


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