X‐ray spectroscopic diagnostics of a copper plasma produced by a laser line focused onto a thin foil

1986 ◽  
Vol 57 (8) ◽  
pp. 2052-2054 ◽  
Author(s):  
T. N. Lee ◽  
W. A. Molander ◽  
J. L. Ford ◽  
R. C. Elton
Keyword(s):  
Thin Foil ◽  
Laser Line ◽  
X Ray ◽  
Spectroscopic Diagnostics ◽  
Copper Plasma

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

Optimizing conditions for x-ray microchemical analysis in analytical electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 548-549 ◽  
Author(s):  
N. J. Zaluzec
Keyword(s):  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
Incident Beam ◽  
Thin Foil ◽  
Experimental Conditions ◽  
X Ray ◽  
Microchemical Analysis ◽  
Analytical Electron ◽  
Image Position ◽  
Incident Beam Energy

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation

Transmission electron microscope studies in special ceramics

1978 ◽  
Vol 36 (1) ◽  
pp. 268-269
Author(s):  
A. Zangvil ◽  
L.J. Gauckler ◽  
G. Schneider ◽  
M. Rühle
Keyword(s):  
Phase Diagrams ◽  
Crystal Structures ◽  
Thin Foil ◽  
Limited Extent ◽  
Complex Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Lattice Resolution

The use of high temperature special ceramics which are usually complex materials based on oxides, nitrides, carbides and borides of silicon and aluminum, is critically dependent on their thermomechanical and other physical properties. The investigations of the phase diagrams, crystal structures and microstructural features are essential for better understanding of the macro-properties. Phase diagrams and crystal structures have been studied mainly by X-ray diffraction (XRD). Transmission electron microscopy (TEM) has contributed to this field to a very limited extent; it has been used more extensively in the study of microstructure, phase transformations and lattice defects. Often only TEM can give solutions to numerous problems in the above fields, since the various phases exist in extremely fine grains and subgrain structures; single crystals of appreciable size are often not available. Examples with some of our experimental results from two multicomponent systems are presented here. The standard ion thinning technique was used for the preparation of thin foil samples, which were then investigated with JEOL 200A and Siemens ELMISKOP 102 (for the lattice resolution work) electron microscopes.

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

X-ray spectroscopic diagnostics of the structure of quantum dots based on zinc and manganese sulfides and oxides

2017 ◽  
Vol 58 (8) ◽  
pp. 1683-1690
Author(s):  
I. A. Pankin ◽  
◽  
A. N. Kravtsova ◽  
O. E. Polozhentsev ◽  
A. P. Budnyk ◽  
...  
Keyword(s):  
Quantum Dots ◽  
X Ray ◽  
Spectroscopic Diagnostics

Calculation of Ion Abundance of Collisional X-Ray Lasers Using Thin Foil Targets.

1999 ◽  
Vol 27 (3) ◽  
pp. 185-189 ◽  
Author(s):  
Akira SASAKI ◽  
Takayuki UTSUMI ◽  
Kengo MORIBAYASHI ◽  
Toshiki TAJIMA ◽  
Hiroshi TAKUMA
Keyword(s):  
Thin Foil ◽  
X Ray

Investigating X-Ray Bragg-Line Displacement as a Technique for Determination of the Thermal Expansion Coefficient of Solid Samples

2004 ◽  
Vol 443-444 ◽  
pp. 151-154 ◽  
Author(s):  
S. Battaglia ◽  
F. Mango
Keyword(s):  
Thermal Expansion ◽  
Thin Foil ◽  
Bulk Sample ◽  
Peak Position ◽  
Metal Foil ◽  
Joule Effect ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Wire Coil ◽  
Heat Dispersion

Thermal expansion coefficients (TEC) of some metallic samples and rocks, along with one sample of amorphous silica, were determined by means of a standard X-ray diffractometer without any modification to the equipment. Only the sample holder was modified in order to fix the sample within the standard goniometer and avoid heat dispersion into the chamber during heating of the sample. The latter was achieved by the Joule effect through a thermo-coaxial wire coil wrapped directly around the bulk sample. A thin metal foil, aluminium in our case, was placed on the flat surface of the cylinder sample. The variations in Al peak position recorded at various sample temperatures were related directly to the dilatation of the material supporting the thin foil.

Studies of Multilayers and Thin-Foil X-Ray Mirrors Using a Soft X-Ray Diffractometer

1990 ◽  
Vol 2 (2) ◽  
pp. 81-94
Author(s):  
F. E. Christensen ◽  
A. Hornstrup ◽  
P. Frederiksen ◽  
P. Grundsøe ◽  
S. Henrichsen ◽  
...  
Keyword(s):  
Thin Foil ◽  
X Ray
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