High‐intensity flash x‐ray apparatus for biomedical radiography

1986 ◽  
Vol 57 (7) ◽  
pp. 1399-1408 ◽  
Author(s):  
E. Sato ◽  
H. Isobe ◽  
F. Hoshino
Keyword(s):  
High Intensity ◽  
X Ray ◽  
Intensity Flash

A Serial-Exposure Type of High Intensity Flash X-ray Generator Having Variable Energies

1986 ◽  
Author(s):  
Eiichi Sato ◽  
Hiroshi Isobe ◽  
Toru Yanagisawa ◽  
Fumihiko Hoshino
Keyword(s):  
High Intensity ◽  
X Ray ◽  
Intensity Flash

Plasma Focus as a High Intensity Flash X-Ray Source for Biological Radiography

2003 ◽  
Vol 22 (3) ◽  
pp. 195-200 ◽  
Author(s):  
S. Hussain ◽  
S. Ahmad ◽  
M. Z. Khan ◽  
M. Zakaullah ◽  
A. Waheed
Keyword(s):  
Plasma Focus ◽  
High Intensity ◽  
X Ray ◽  
Intensity Flash

A High Intensity Flash X-ray Tube

1972 ◽  
Vol 6 (2-3) ◽  
pp. 172-174 ◽  
Author(s):  
A Mattsson
Keyword(s):  
High Intensity ◽  
X Ray ◽  
Intensity Flash

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer
Keyword(s):  
High Intensity ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Pyrolytic Graphite ◽  
Trace Element Analysis ◽  
Detection Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Wide Range ◽  
Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

A wide-aperture x-ray source with high intensity and uniformity of radiation

2007 ◽  
Vol 50 (1) ◽  
pp. 95-99
Author(s):  
N. G. Ivanov ◽  
I. N. Konovalov ◽  
V. F. Losev ◽  
Yu. N. Panchenko
Keyword(s):  
High Intensity ◽  
X Ray ◽  
Wide Aperture
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