Nondispersive x‐ray spectroscopy and imaging of plasmas using a charge−coupled device

1985 ◽  
Vol 56 (5) ◽  
pp. 837-839 ◽  
Author(s):  
K. Marsh ◽  
C. Joshi ◽  
J. Janesick ◽  
S. Collins
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
A Charge

Characterization of an x-ray framing camera utilizing a charge coupled device or film as recording media

1998 ◽  
Vol 69 (12) ◽  
pp. 4054-4060 ◽  
Author(s):  
L. M. Logory ◽  
D. R. Farley ◽  
A. D. Conder ◽  
E. A. Belli ◽  
P. M. Bell ◽  
...  
Keyword(s):  
Recording Media ◽  
Charge Coupled Device ◽  
X Ray ◽  
A Charge ◽  
Framing Camera

Development of a high-resolution x-ray imaging system with a charge-coupled-device detector coupled with crystal x-ray magnifiers

2000 ◽  
Vol 71 (12) ◽  
pp. 4449 ◽  
Author(s):  
K. Sato ◽  
Y. Hasegawa ◽  
K. Kondo ◽  
K. Miyazaki ◽  
T. Matsushita ◽  
...  
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Charge Coupled Device ◽  
X Ray ◽  
X Ray Imaging ◽  
A Charge

Energy spectrometer on a diffractometer using a charge-coupled device X-ray detector

2006 ◽  
Vol 39 (5) ◽  
pp. 767-770
Author(s):  
Hiroshi Abe ◽  
Hiroyuki Saitoh ◽  
Hironori Nakao ◽  
Kazuki Ito ◽  
Ken-ichi Ohshima
Keyword(s):  
Pyrolytic Graphite ◽  
High Energy ◽  
Energy Spectra ◽  
Time Data ◽  
Charge Coupled Device ◽  
X Ray ◽  
High Energy Accelerator ◽  
X Ray Scattering ◽  
Energy Spectrometer ◽  
A Charge

A charge-coupled device (CCD) X-ray detector for inelastic X-ray scattering was installed at beamline BL-4C of the Photon Factory at the High Energy Accelerator Research Organization in Japan. A wavelength-dispersive X-ray spectrometer was mounted on a six-circle diffractometer. Energy spectra were obtained by the CCD X-ray detector and a curved highly oriented pyrolytic graphite analyser. By the combination of energy spectroscopy and diffraction, simultaneous real-time data acquisition of both the momentum and the energy transfer was performed.

Use of a CCD-Based Area Detection System on a Fibre Diffractometer

1994 ◽  
Vol 38 ◽  
pp. 503-510 ◽  
Author(s):  
S. Hanna ◽  
A.H. Windle
Keyword(s):  
Detection System ◽  
Single Point ◽  
Video Camera ◽  
Reciprocal Space ◽  
Charge Coupled Device ◽  
X Ray ◽  
Complete Section ◽  
Ewald Sphere ◽  
Pros And Cons ◽  
A Charge

Abstract We describe a new X-ray fibre diffractometer, consisting of a commercial X-ray sensitive video camera coupled to a conventional 3-circle goniometer in place of a more traditional single-point detector. The active element of the video camera is a charge-coupled device (CCD). Diffraction images, obtained at various goniometer settings, are transformed into reciprocal space, and combined to give a complete section through the origin and parallel to the symmetry axis of cyiindrically averaged reciprocal space. A greater density of measurements is needed in the vicinity of the reciprocal fibre axis in order to avoid information loss due to the curvature of the Ewald sphere. The pros and cons of using CCD's as X-ray detectors are discussed and sample results from polymer fibres are shown.

Using a charge-coupled device (CCD) to simultaneously gather x-ray fluorescence (XRF) and x-ray diffraction (XRD) information

2002 ◽  
Author(s):  
S. Cornaby ◽  
T. D. Grow ◽  
Arturo Reyes-Mena ◽  
Paul W. Moody ◽  
A. Stradling ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Charge Coupled Device ◽  
X Ray ◽  
A Charge

Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry

2014 ◽  
Vol 20 (3) ◽  
pp. 692-697 ◽  
Author(s):  
Masami Terauchi ◽  
Shogo Koshiya ◽  
Futami Satoh ◽  
Hideyuki Takahashi ◽  
Nobuo Handa ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Grazing Incidence ◽  
Emission Spectrometry ◽  
Charge Coupled Device ◽  
X Ray ◽  
Transmission Electron ◽  
Line Spacing ◽  
A Charge ◽  
Electron Energy Loss ◽  
Si Wafer

AbstractElectron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer was designed as a grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and a multichannel plate detector combined with a charge-coupled device camera, which has already been applied to a transmission electron microscope. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which is comparable with that of recent dedicated electron energy-loss spectroscopy instruments. This SXES-SEM instrument presents density of states of simple metals of bulk Mg and Li. Apparent band-structure effects have been observed in Si L-emission of Si wafer, P L-emission of GaP wafer, and Al L-emissions of intermetallic compounds of AlCo, AlPd, Al2Pt, and Al2Au.

Soft X-Ray And XUV Imaging With A Charge-Coupled Device (CCD)-Based Detector

1981 ◽  
Author(s):  
N. G. Loter ◽  
P. Burstein ◽  
A. Krieger ◽  
D. Ross ◽  
D. Harrison ◽  
...  
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
A Charge
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